sistema e método para processar amostras
resumo patente de invenção: "sistema e método para processar amostras". a presente invenção refere-se a um sistema de laboratório analítico e um método que permite o processamento de amostras. o sistema inclui uma unidade de gerenciador. o sistema inclui ainda uma unidade de aliquotador, a...
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| creator | ANDREAS WEIHS GERHARD GUNZER MARTIN MUELLER CHI S. CHEN MICHAEL EBERHARDT STEPHEN L. OTTS JOSEPH F. QUINT SAMUEL H. RIZZOTTE CHARLES W. JOHNS |
| description | resumo patente de invenção: "sistema e método para processar amostras". a presente invenção refere-se a um sistema de laboratório analítico e um método que permite o processamento de amostras. o sistema inclui uma unidade de gerenciador. o sistema inclui ainda uma unidade de aliquotador, além de incluir uma unidade de centrífuga.
An analytical laboratory system and method for processing samples is disclosed. The system includes a manager unit, as well as an aliquotter unit and a centrifuge unit. |
| format | Patent |
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An analytical laboratory system and method for processing samples is disclosed. The system includes a manager unit, as well as an aliquotter unit and a centrifuge unit.</description><language>por</language><subject>CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL ORCHEMICAL PROCESSES ; CENTRIFUGES ; CHAMBERS PROVIDED WITH MANIPULATION DEVICES ; CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE ; HAND TOOLS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MANIPULATORS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; PORTABLE POWER-DRIVEN TOOLS ; SEPARATION ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR ; TRANSPORTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170606&DB=EPODOC&CC=BR&NR=112014010955A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170606&DB=EPODOC&CC=BR&NR=112014010955A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ANDREAS WEIHS</creatorcontrib><creatorcontrib>GERHARD GUNZER</creatorcontrib><creatorcontrib>MARTIN MUELLER</creatorcontrib><creatorcontrib>CHI S. CHEN</creatorcontrib><creatorcontrib>MICHAEL EBERHARDT</creatorcontrib><creatorcontrib>STEPHEN L. OTTS</creatorcontrib><creatorcontrib>JOSEPH F. QUINT</creatorcontrib><creatorcontrib>SAMUEL H. RIZZOTTE</creatorcontrib><creatorcontrib>CHARLES W. JOHNS</creatorcontrib><title>sistema e método para processar amostras</title><description>resumo patente de invenção: "sistema e método para processar amostras". a presente invenção refere-se a um sistema de laboratório analítico e um método que permite o processamento de amostras. o sistema inclui uma unidade de gerenciador. o sistema inclui ainda uma unidade de aliquotador, além de incluir uma unidade de centrífuga.
An analytical laboratory system and method for processing samples is disclosed. The system includes a manager unit, as well as an aliquotter unit and a centrifuge unit.</description><subject>CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL ORCHEMICAL PROCESSES</subject><subject>CENTRIFUGES</subject><subject>CHAMBERS PROVIDED WITH MANIPULATION DEVICES</subject><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</subject><subject>HAND TOOLS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MANIPULATORS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>PORTABLE POWER-DRIVEN TOOLS</subject><subject>SEPARATION</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAsziwuSc1NVEhVyD28siQ_JV-hILEoUaGgKD85tbg4sUghMTe_uKQosZiHgTUtMac4lRdKczOourmGOHvophbkx6cWFyQmp-allsQ7BRkaGhkYmhgYGliamjoaGROrDgCggysG</recordid><startdate>20170606</startdate><enddate>20170606</enddate><creator>ANDREAS WEIHS</creator><creator>GERHARD GUNZER</creator><creator>MARTIN MUELLER</creator><creator>CHI S. CHEN</creator><creator>MICHAEL EBERHARDT</creator><creator>STEPHEN L. OTTS</creator><creator>JOSEPH F. QUINT</creator><creator>SAMUEL H. RIZZOTTE</creator><creator>CHARLES W. JOHNS</creator><scope>EVB</scope></search><sort><creationdate>20170606</creationdate><title>sistema e método para processar amostras</title><author>ANDREAS WEIHS ; GERHARD GUNZER ; MARTIN MUELLER ; CHI S. CHEN ; MICHAEL EBERHARDT ; STEPHEN L. OTTS ; JOSEPH F. QUINT ; SAMUEL H. RIZZOTTE ; CHARLES W. JOHNS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_BR112014010955A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>por</language><creationdate>2017</creationdate><topic>CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL ORCHEMICAL PROCESSES</topic><topic>CENTRIFUGES</topic><topic>CHAMBERS PROVIDED WITH MANIPULATION DEVICES</topic><topic>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</topic><topic>HAND TOOLS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MANIPULATORS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>PORTABLE POWER-DRIVEN TOOLS</topic><topic>SEPARATION</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ANDREAS WEIHS</creatorcontrib><creatorcontrib>GERHARD GUNZER</creatorcontrib><creatorcontrib>MARTIN MUELLER</creatorcontrib><creatorcontrib>CHI S. CHEN</creatorcontrib><creatorcontrib>MICHAEL EBERHARDT</creatorcontrib><creatorcontrib>STEPHEN L. OTTS</creatorcontrib><creatorcontrib>JOSEPH F. QUINT</creatorcontrib><creatorcontrib>SAMUEL H. RIZZOTTE</creatorcontrib><creatorcontrib>CHARLES W. JOHNS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ANDREAS WEIHS</au><au>GERHARD GUNZER</au><au>MARTIN MUELLER</au><au>CHI S. CHEN</au><au>MICHAEL EBERHARDT</au><au>STEPHEN L. OTTS</au><au>JOSEPH F. QUINT</au><au>SAMUEL H. RIZZOTTE</au><au>CHARLES W. JOHNS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>sistema e método para processar amostras</title><date>2017-06-06</date><risdate>2017</risdate><abstract>resumo patente de invenção: "sistema e método para processar amostras". a presente invenção refere-se a um sistema de laboratório analítico e um método que permite o processamento de amostras. o sistema inclui uma unidade de gerenciador. o sistema inclui ainda uma unidade de aliquotador, além de incluir uma unidade de centrífuga.
An analytical laboratory system and method for processing samples is disclosed. The system includes a manager unit, as well as an aliquotter unit and a centrifuge unit.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL ORCHEMICAL PROCESSES CENTRIFUGES CHAMBERS PROVIDED WITH MANIPULATION DEVICES CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE HAND TOOLS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANIPULATORS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS PORTABLE POWER-DRIVEN TOOLS SEPARATION TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING |
| title | sistema e método para processar amostras |
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