METHOD AND DEVICE FOR MEASURING THE PARAMETERS OF SUPERCONDUCTING LAYERS

The method and the device can be applied in kryoelectronics and instrumentation engineering. By them the samples are not destroyed, simultaneous and synchronous measurements of the relations of the specific resistance , the real x' and the imaginary x" parts of the magnetic susceptibility...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	GORANCHEV, BOZHIDAR G, NURGALIEV, TIMERFAJAZ KH, TASLAKOV, MARIAN A, SPASOV, ALEKSANDAR JA
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!