ELECTRON SPIN RESONANCE SPECTROMETER
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| creator | DONALD R. HUTTON NEIL R. MCLAREN GORDON J.F. TROUP JOHN R. PILBROW LUCIAN GRUNER ANATOL Z. TIRKEL |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU7918787A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU7918787A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU7918787A3</originalsourceid><addsrcrecordid>eNrjZFBx9XF1Dgny91MIDvD0UwhyDfb3c_RzdgVyweK-riGuQTwMrGmJOcWpvFCam0HezTXE2UM3tSA_PrW4IDE5NS-1JN4x1NzS0MLcwtzRmLAKABRVIqA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELECTRON SPIN RESONANCE SPECTROMETER</title><source>esp@cenet</source><creator>DONALD R. HUTTON ; NEIL R. MCLAREN ; GORDON J.F. TROUP ; JOHN R. PILBROW ; LUCIAN GRUNER ; ANATOL Z. TIRKEL</creator><creatorcontrib>DONALD R. HUTTON ; NEIL R. MCLAREN ; GORDON J.F. TROUP ; JOHN R. PILBROW ; LUCIAN GRUNER ; ANATOL Z. TIRKEL</creatorcontrib><edition>4</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1988</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19880407&DB=EPODOC&CC=AU&NR=7918787A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19880407&DB=EPODOC&CC=AU&NR=7918787A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DONALD R. HUTTON</creatorcontrib><creatorcontrib>NEIL R. MCLAREN</creatorcontrib><creatorcontrib>GORDON J.F. TROUP</creatorcontrib><creatorcontrib>JOHN R. PILBROW</creatorcontrib><creatorcontrib>LUCIAN GRUNER</creatorcontrib><creatorcontrib>ANATOL Z. TIRKEL</creatorcontrib><title>ELECTRON SPIN RESONANCE SPECTROMETER</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1988</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBx9XF1Dgny91MIDvD0UwhyDfb3c_RzdgVyweK-riGuQTwMrGmJOcWpvFCam0HezTXE2UM3tSA_PrW4IDE5NS-1JN4x1NzS0MLcwtzRmLAKABRVIqA</recordid><startdate>19880407</startdate><enddate>19880407</enddate><creator>DONALD R. HUTTON</creator><creator>NEIL R. MCLAREN</creator><creator>GORDON J.F. TROUP</creator><creator>JOHN R. PILBROW</creator><creator>LUCIAN GRUNER</creator><creator>ANATOL Z. TIRKEL</creator><scope>EVB</scope></search><sort><creationdate>19880407</creationdate><title>ELECTRON SPIN RESONANCE SPECTROMETER</title><author>DONALD R. HUTTON ; NEIL R. MCLAREN ; GORDON J.F. TROUP ; JOHN R. PILBROW ; LUCIAN GRUNER ; ANATOL Z. TIRKEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU7918787A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1988</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DONALD R. HUTTON</creatorcontrib><creatorcontrib>NEIL R. MCLAREN</creatorcontrib><creatorcontrib>GORDON J.F. TROUP</creatorcontrib><creatorcontrib>JOHN R. PILBROW</creatorcontrib><creatorcontrib>LUCIAN GRUNER</creatorcontrib><creatorcontrib>ANATOL Z. TIRKEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DONALD R. HUTTON</au><au>NEIL R. MCLAREN</au><au>GORDON J.F. TROUP</au><au>JOHN R. PILBROW</au><au>LUCIAN GRUNER</au><au>ANATOL Z. TIRKEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTRON SPIN RESONANCE SPECTROMETER</title><date>1988-04-07</date><risdate>1988</risdate><edition>4</edition><oa>free_for_read</oa></addata></record> |
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| language | eng |
| recordid | cdi_epo_espacenet_AU7918787A |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | ELECTRON SPIN RESONANCE SPECTROMETER |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T07%3A04%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DONALD%20R.%20HUTTON&rft.date=1988-04-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU7918787A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |