Multi-angle inspection for products

An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to p...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MARK R DEYONG, ROBERT W. TAIT, ALVARO D. LEWIN
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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