Multi-angle inspection for products
An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to p...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | MARK R DEYONG ROBERT W. TAIT ALVARO D. LEWIN |
| description | An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to produce a wavelength of light which is not produced by another light source group. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU7591501A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU7591501A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU7591501A3</originalsourceid><addsrcrecordid>eNrjZFD2Lc0pydRNzEvPSVXIzCsuSE0uyczPU0jLL1IoKMpPKU0uKeZhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfGOoeamloamBoaOxoRVAABj1SXe</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Multi-angle inspection for products</title><source>esp@cenet</source><creator>MARK R DEYONG ; ROBERT W. TAIT ; ALVARO D. LEWIN</creator><creatorcontrib>MARK R DEYONG ; ROBERT W. TAIT ; ALVARO D. LEWIN</creatorcontrib><description>An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to produce a wavelength of light which is not produced by another light source group.</description><edition>7</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020130&DB=EPODOC&CC=AU&NR=7591501A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020130&DB=EPODOC&CC=AU&NR=7591501A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARK R DEYONG</creatorcontrib><creatorcontrib>ROBERT W. TAIT</creatorcontrib><creatorcontrib>ALVARO D. LEWIN</creatorcontrib><title>Multi-angle inspection for products</title><description>An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to produce a wavelength of light which is not produced by another light source group.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD2Lc0pydRNzEvPSVXIzCsuSE0uyczPU0jLL1IoKMpPKU0uKeZhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfGOoeamloamBoaOxoRVAABj1SXe</recordid><startdate>20020130</startdate><enddate>20020130</enddate><creator>MARK R DEYONG</creator><creator>ROBERT W. TAIT</creator><creator>ALVARO D. LEWIN</creator><scope>EVB</scope></search><sort><creationdate>20020130</creationdate><title>Multi-angle inspection for products</title><author>MARK R DEYONG ; ROBERT W. TAIT ; ALVARO D. LEWIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU7591501A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MARK R DEYONG</creatorcontrib><creatorcontrib>ROBERT W. TAIT</creatorcontrib><creatorcontrib>ALVARO D. LEWIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MARK R DEYONG</au><au>ROBERT W. TAIT</au><au>ALVARO D. LEWIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Multi-angle inspection for products</title><date>2002-01-30</date><risdate>2002</risdate><abstract>An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to produce a wavelength of light which is not produced by another light source group.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_AU7591501A |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Multi-angle inspection for products |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T06%3A31%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MARK%20R%20DEYONG&rft.date=2002-01-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU7591501A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |