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creator JAMES CLEMENT BISHOP
ARTHUR ROUSMANIERE
DONALD MEYER
JOANNE T. GERST
DAVID PORAT
ERIC WILLIAM ANTHON
THOMAS H. BURCHARD
DAVID CHASTAIN
CLIFFORD W. KARL
KENT C. SMITH
DAVID SHINE
CRAIG DRAGER
RON ROBINSON
DANIEL RAY WILLIAMS
ANDREW MOORE
ANDREW ZEIGLER
GREG FLENDER
JEAN-PIERRE BERNARD GAYRAL
STEPHEN GUERRERA
BERNARD JEAN MARIE LIMON
ROGER JAMES MORRIS
MARK JOSEPH FANNING
PAUL SPRINGER
RAYMOND E. O'BEAR
RICHARD JAMES RYALL
WILLIAM EARNEST SEATON
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU5610299A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU5610299A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU5610299A3</originalsourceid><addsrcrecordid>eNrjZJBwLC3Jz00syUxWKE7MLchJVShJLS7JzEvnYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxjqGmZoYGRpaWjsaEVQAAgc4hrA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic sample testing</title><source>esp@cenet</source><creator>JAMES CLEMENT BISHOP ; ARTHUR ROUSMANIERE ; DONALD MEYER ; JOANNE T. GERST ; DAVID PORAT ; ERIC WILLIAM ANTHON ; THOMAS H. BURCHARD ; DAVID CHASTAIN ; CLIFFORD W. KARL ; KENT C. SMITH ; DAVID SHINE ; CRAIG DRAGER ; RON ROBINSON ; DANIEL RAY WILLIAMS ; ANDREW MOORE ; ANDREW ZEIGLER ; GREG FLENDER ; JEAN-PIERRE BERNARD GAYRAL ; STEPHEN GUERRERA ; BERNARD JEAN MARIE LIMON ; ROGER JAMES MORRIS ; MARK JOSEPH FANNING ; PAUL SPRINGER ; RAYMOND E. O'BEAR ; RICHARD JAMES RYALL ; WILLIAM EARNEST SEATON</creator><creatorcontrib>JAMES CLEMENT BISHOP ; ARTHUR ROUSMANIERE ; DONALD MEYER ; JOANNE T. GERST ; DAVID PORAT ; ERIC WILLIAM ANTHON ; THOMAS H. BURCHARD ; DAVID CHASTAIN ; CLIFFORD W. KARL ; KENT C. SMITH ; DAVID SHINE ; CRAIG DRAGER ; RON ROBINSON ; DANIEL RAY WILLIAMS ; ANDREW MOORE ; ANDREW ZEIGLER ; GREG FLENDER ; JEAN-PIERRE BERNARD GAYRAL ; STEPHEN GUERRERA ; BERNARD JEAN MARIE LIMON ; ROGER JAMES MORRIS ; MARK JOSEPH FANNING ; PAUL SPRINGER ; RAYMOND E. O'BEAR ; RICHARD JAMES RYALL ; WILLIAM EARNEST SEATON</creatorcontrib><edition>6</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000203&amp;DB=EPODOC&amp;CC=AU&amp;NR=5610299A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000203&amp;DB=EPODOC&amp;CC=AU&amp;NR=5610299A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JAMES CLEMENT BISHOP</creatorcontrib><creatorcontrib>ARTHUR ROUSMANIERE</creatorcontrib><creatorcontrib>DONALD MEYER</creatorcontrib><creatorcontrib>JOANNE T. GERST</creatorcontrib><creatorcontrib>DAVID PORAT</creatorcontrib><creatorcontrib>ERIC WILLIAM ANTHON</creatorcontrib><creatorcontrib>THOMAS H. BURCHARD</creatorcontrib><creatorcontrib>DAVID CHASTAIN</creatorcontrib><creatorcontrib>CLIFFORD W. KARL</creatorcontrib><creatorcontrib>KENT C. SMITH</creatorcontrib><creatorcontrib>DAVID SHINE</creatorcontrib><creatorcontrib>CRAIG DRAGER</creatorcontrib><creatorcontrib>RON ROBINSON</creatorcontrib><creatorcontrib>DANIEL RAY WILLIAMS</creatorcontrib><creatorcontrib>ANDREW MOORE</creatorcontrib><creatorcontrib>ANDREW ZEIGLER</creatorcontrib><creatorcontrib>GREG FLENDER</creatorcontrib><creatorcontrib>JEAN-PIERRE BERNARD GAYRAL</creatorcontrib><creatorcontrib>STEPHEN GUERRERA</creatorcontrib><creatorcontrib>BERNARD JEAN MARIE LIMON</creatorcontrib><creatorcontrib>ROGER JAMES MORRIS</creatorcontrib><creatorcontrib>MARK JOSEPH FANNING</creatorcontrib><creatorcontrib>PAUL SPRINGER</creatorcontrib><creatorcontrib>RAYMOND E. O'BEAR</creatorcontrib><creatorcontrib>RICHARD JAMES RYALL</creatorcontrib><creatorcontrib>WILLIAM EARNEST SEATON</creatorcontrib><title>Automatic sample testing</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBwLC3Jz00syUxWKE7MLchJVShJLS7JzEvnYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxjqGmZoYGRpaWjsaEVQAAgc4hrA</recordid><startdate>20000203</startdate><enddate>20000203</enddate><creator>JAMES CLEMENT BISHOP</creator><creator>ARTHUR ROUSMANIERE</creator><creator>DONALD MEYER</creator><creator>JOANNE T. GERST</creator><creator>DAVID PORAT</creator><creator>ERIC WILLIAM ANTHON</creator><creator>THOMAS H. BURCHARD</creator><creator>DAVID CHASTAIN</creator><creator>CLIFFORD W. KARL</creator><creator>KENT C. SMITH</creator><creator>DAVID SHINE</creator><creator>CRAIG DRAGER</creator><creator>RON ROBINSON</creator><creator>DANIEL RAY WILLIAMS</creator><creator>ANDREW MOORE</creator><creator>ANDREW ZEIGLER</creator><creator>GREG FLENDER</creator><creator>JEAN-PIERRE BERNARD GAYRAL</creator><creator>STEPHEN GUERRERA</creator><creator>BERNARD JEAN MARIE LIMON</creator><creator>ROGER JAMES MORRIS</creator><creator>MARK JOSEPH FANNING</creator><creator>PAUL SPRINGER</creator><creator>RAYMOND E. O'BEAR</creator><creator>RICHARD JAMES RYALL</creator><creator>WILLIAM EARNEST SEATON</creator><scope>EVB</scope></search><sort><creationdate>20000203</creationdate><title>Automatic sample testing</title><author>JAMES CLEMENT BISHOP ; ARTHUR ROUSMANIERE ; DONALD MEYER ; JOANNE T. GERST ; DAVID PORAT ; ERIC WILLIAM ANTHON ; THOMAS H. BURCHARD ; DAVID CHASTAIN ; CLIFFORD W. KARL ; KENT C. SMITH ; DAVID SHINE ; CRAIG DRAGER ; RON ROBINSON ; DANIEL RAY WILLIAMS ; ANDREW MOORE ; ANDREW ZEIGLER ; GREG FLENDER ; JEAN-PIERRE BERNARD GAYRAL ; STEPHEN GUERRERA ; BERNARD JEAN MARIE LIMON ; ROGER JAMES MORRIS ; MARK JOSEPH FANNING ; PAUL SPRINGER ; RAYMOND E. O'BEAR ; RICHARD JAMES RYALL ; WILLIAM EARNEST SEATON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU5610299A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JAMES CLEMENT BISHOP</creatorcontrib><creatorcontrib>ARTHUR ROUSMANIERE</creatorcontrib><creatorcontrib>DONALD MEYER</creatorcontrib><creatorcontrib>JOANNE T. GERST</creatorcontrib><creatorcontrib>DAVID PORAT</creatorcontrib><creatorcontrib>ERIC WILLIAM ANTHON</creatorcontrib><creatorcontrib>THOMAS H. BURCHARD</creatorcontrib><creatorcontrib>DAVID CHASTAIN</creatorcontrib><creatorcontrib>CLIFFORD W. KARL</creatorcontrib><creatorcontrib>KENT C. SMITH</creatorcontrib><creatorcontrib>DAVID SHINE</creatorcontrib><creatorcontrib>CRAIG DRAGER</creatorcontrib><creatorcontrib>RON ROBINSON</creatorcontrib><creatorcontrib>DANIEL RAY WILLIAMS</creatorcontrib><creatorcontrib>ANDREW MOORE</creatorcontrib><creatorcontrib>ANDREW ZEIGLER</creatorcontrib><creatorcontrib>GREG FLENDER</creatorcontrib><creatorcontrib>JEAN-PIERRE BERNARD GAYRAL</creatorcontrib><creatorcontrib>STEPHEN GUERRERA</creatorcontrib><creatorcontrib>BERNARD JEAN MARIE LIMON</creatorcontrib><creatorcontrib>ROGER JAMES MORRIS</creatorcontrib><creatorcontrib>MARK JOSEPH FANNING</creatorcontrib><creatorcontrib>PAUL SPRINGER</creatorcontrib><creatorcontrib>RAYMOND E. O'BEAR</creatorcontrib><creatorcontrib>RICHARD JAMES RYALL</creatorcontrib><creatorcontrib>WILLIAM EARNEST SEATON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JAMES CLEMENT BISHOP</au><au>ARTHUR ROUSMANIERE</au><au>DONALD MEYER</au><au>JOANNE T. GERST</au><au>DAVID PORAT</au><au>ERIC WILLIAM ANTHON</au><au>THOMAS H. BURCHARD</au><au>DAVID CHASTAIN</au><au>CLIFFORD W. KARL</au><au>KENT C. SMITH</au><au>DAVID SHINE</au><au>CRAIG DRAGER</au><au>RON ROBINSON</au><au>DANIEL RAY WILLIAMS</au><au>ANDREW MOORE</au><au>ANDREW ZEIGLER</au><au>GREG FLENDER</au><au>JEAN-PIERRE BERNARD GAYRAL</au><au>STEPHEN GUERRERA</au><au>BERNARD JEAN MARIE LIMON</au><au>ROGER JAMES MORRIS</au><au>MARK JOSEPH FANNING</au><au>PAUL SPRINGER</au><au>RAYMOND E. O'BEAR</au><au>RICHARD JAMES RYALL</au><au>WILLIAM EARNEST SEATON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic sample testing</title><date>2000-02-03</date><risdate>2000</risdate><edition>6</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_AU5610299A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Automatic sample testing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T01%3A33%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JAMES%20CLEMENT%20BISHOP&rft.date=2000-02-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU5610299A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true