METHODS AND SYSTEMS FOR ENHANCED INTERFEROMETRIC DETECTION AND CHARACTERIZATION OF SINGLE PARTICLES VIA THREE-DIMENSIONAL IMAGE REGISTRATION

Presented herein are systems and methods for analyzing images of target particles that are bound to a surface of a substrate. In certain embodiments, systems and method described herein utilize techniques that remove background noise from interferometric images of small particles, allowing for incre...

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Bibliographische Detailangaben
Hauptverfasser:	ZIMMERMANN, Dennis Alexander, DAABOUL, George G, FREEDMAN, David S, LITHGOW, Gregg, SCHERR, Steven M, SOOD, Chetan, AKHYAR, Mubtasim, ANDERSON, Leif Stefan
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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