METHODS AND SYSTEMS FOR ENHANCED INTERFEROMETRIC DETECTION AND CHARACTERIZATION OF SINGLE PARTICLES VIA THREE-DIMENSIONAL IMAGE REGISTRATION
Presented herein are systems and methods for analyzing images of target particles that are bound to a surface of a substrate. In certain embodiments, systems and method described herein utilize techniques that remove background noise from interferometric images of small particles, allowing for incre...
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| creator | ZIMMERMANN, Dennis Alexander DAABOUL, George G FREEDMAN, David S LITHGOW, Gregg SCHERR, Steven M SOOD, Chetan AKHYAR, Mubtasim ANDERSON, Leif Stefan |
| description | Presented herein are systems and methods for analyzing images of target particles that are bound to a surface of a substrate. In certain embodiments, systems and method described herein utilize techniques that remove background noise from interferometric images of small particles, allowing for increased accuracy in detection and/or characterization of individual particles. Such techniques, as described herein, may allow individual particles having sizes below about 100 nm (e.g., below about 50 nm; e.g., down to 20 nm) to be accurately detected within images, and, among other things, their characteristic sizes measured utilizing, e.g., their contrast. |
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In certain embodiments, systems and method described herein utilize techniques that remove background noise from interferometric images of small particles, allowing for increased accuracy in detection and/or characterization of individual particles. Such techniques, as described herein, may allow individual particles having sizes below about 100 nm (e.g., below about 50 nm; e.g., down to 20 nm) to be accurately detected within images, and, among other things, their characteristic sizes measured utilizing, e.g., their contrast.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; FREQUENCY-CHANGING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240808&DB=EPODOC&CC=AU&NR=2023213965A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240808&DB=EPODOC&CC=AU&NR=2023213965A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZIMMERMANN, Dennis Alexander</creatorcontrib><creatorcontrib>DAABOUL, George G</creatorcontrib><creatorcontrib>FREEDMAN, David S</creatorcontrib><creatorcontrib>LITHGOW, Gregg</creatorcontrib><creatorcontrib>SCHERR, Steven M</creatorcontrib><creatorcontrib>SOOD, Chetan</creatorcontrib><creatorcontrib>AKHYAR, Mubtasim</creatorcontrib><creatorcontrib>ANDERSON, Leif Stefan</creatorcontrib><title>METHODS AND SYSTEMS FOR ENHANCED INTERFEROMETRIC DETECTION AND CHARACTERIZATION OF SINGLE PARTICLES VIA THREE-DIMENSIONAL IMAGE REGISTRATION</title><description>Presented herein are systems and methods for analyzing images of target particles that are bound to a surface of a substrate. 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In certain embodiments, systems and method described herein utilize techniques that remove background noise from interferometric images of small particles, allowing for increased accuracy in detection and/or characterization of individual particles. Such techniques, as described herein, may allow individual particles having sizes below about 100 nm (e.g., below about 50 nm; e.g., down to 20 nm) to be accurately detected within images, and, among other things, their characteristic sizes measured utilizing, e.g., their contrast.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | METHODS AND SYSTEMS FOR ENHANCED INTERFEROMETRIC DETECTION AND CHARACTERIZATION OF SINGLE PARTICLES VIA THREE-DIMENSIONAL IMAGE REGISTRATION |
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