METHOD FOR QUANTITATIVELY ANALYZING ELEMENTS

METHOD FOR QUANTITATIVELY ANALYZING ELEMENTS

The present invention provides a method for quantitatively analyzing elements within a sample gas such as LA-ICP-MS without using a solid standard sample. The present invention is a method in which a sample gas is introduced into an inductively coupled plasma mass spectrometer and the elements of a...

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Hauptverfasser: SUZUKI Koshi, ICHINOSE Tatsuya, KAWABATA Katsuhiko
Format: Patent
Sprache:eng
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BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator SUZUKI Koshi
ICHINOSE Tatsuya
KAWABATA Katsuhiko
description The present invention provides a method for quantitatively analyzing elements within a sample gas such as LA-ICP-MS without using a solid standard sample. The present invention is a method in which a sample gas is introduced into an inductively coupled plasma mass spectrometer and the elements of a solid sample are quantitatively analyzed, wherein the method is characterized in that a standard solution containing specific elements at known concentrations is directly supplied (by standard addition) at a flow rate of 3 μL/min or less, and the concentrations of the elements included in the sample gas generated from the solid sample are thereby measured using a signal strength obtained by introducing the standard solution to a torch section from a solution introduction means.
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR QUANTITATIVELY ANALYZING ELEMENTS
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