Quality control method of specimen analysis system and specimen analysis system

Quality control method of specimen analysis system and specimen analysis system

Disclosed is a quality control method of a specimen analysis system, including: cooling and storing a quality control material including a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuri...

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Hauptverfasser: Wakamiya, Yuji, Hayama, Hidetaka, Uemura, Toru, Ohmae, Yuichiro
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Wakamiya, Yuji
Hayama, Hidetaka
Uemura, Toru
Ohmae, Yuichiro
description Disclosed is a quality control method of a specimen analysis system, including: cooling and storing a quality control material including a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuring the quality control material by the analyzer. CNr oo co CD CI co Z ~1--- rr 6 --- J --- --- C)) --- c~9 o I-u U uj
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU2022201245A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU2022201245A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU2022201245A13</originalsourceid><addsrcrecordid>eNrjZPAPLE3MySypVEjOzyspys9RyE0tychPUchPUyguSE3OzE3NU0jMS8ypLM4sViiuLC5JzQXyU3BK8jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSSeMdQIwMjIyMDQyMTU0dDY-JUAQCGjDhb</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Quality control method of specimen analysis system and specimen analysis system</title><source>esp@cenet</source><creator>Wakamiya, Yuji ; Hayama, Hidetaka ; Uemura, Toru ; Ohmae, Yuichiro</creator><creatorcontrib>Wakamiya, Yuji ; Hayama, Hidetaka ; Uemura, Toru ; Ohmae, Yuichiro</creatorcontrib><description>Disclosed is a quality control method of a specimen analysis system, including: cooling and storing a quality control material including a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuring the quality control material by the analyzer. CNr oo co CD CI co Z ~1--- rr 6 --- J --- --- C)) --- c~9 o I-u U uj</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220922&amp;DB=EPODOC&amp;CC=AU&amp;NR=2022201245A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220922&amp;DB=EPODOC&amp;CC=AU&amp;NR=2022201245A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wakamiya, Yuji</creatorcontrib><creatorcontrib>Hayama, Hidetaka</creatorcontrib><creatorcontrib>Uemura, Toru</creatorcontrib><creatorcontrib>Ohmae, Yuichiro</creatorcontrib><title>Quality control method of specimen analysis system and specimen analysis system</title><description>Disclosed is a quality control method of a specimen analysis system, including: cooling and storing a quality control material including a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuring the quality control material by the analyzer. CNr oo co CD CI co Z ~1--- rr 6 --- J --- --- C)) --- c~9 o I-u U uj</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAPLE3MySypVEjOzyspys9RyE0tychPUchPUyguSE3OzE3NU0jMS8ypLM4sViiuLC5JzQXyU3BK8jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSSeMdQIwMjIyMDQyMTU0dDY-JUAQCGjDhb</recordid><startdate>20220922</startdate><enddate>20220922</enddate><creator>Wakamiya, Yuji</creator><creator>Hayama, Hidetaka</creator><creator>Uemura, Toru</creator><creator>Ohmae, Yuichiro</creator><scope>EVB</scope></search><sort><creationdate>20220922</creationdate><title>Quality control method of specimen analysis system and specimen analysis system</title><author>Wakamiya, Yuji ; Hayama, Hidetaka ; Uemura, Toru ; Ohmae, Yuichiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU2022201245A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Wakamiya, Yuji</creatorcontrib><creatorcontrib>Hayama, Hidetaka</creatorcontrib><creatorcontrib>Uemura, Toru</creatorcontrib><creatorcontrib>Ohmae, Yuichiro</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wakamiya, Yuji</au><au>Hayama, Hidetaka</au><au>Uemura, Toru</au><au>Ohmae, Yuichiro</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Quality control method of specimen analysis system and specimen analysis system</title><date>2022-09-22</date><risdate>2022</risdate><abstract>Disclosed is a quality control method of a specimen analysis system, including: cooling and storing a quality control material including a cell of known concentration; heating the cooled and stored quality control material; transporting the heated quality control material to an analyzer; and measuring the quality control material by the analyzer. CNr oo co CD CI co Z ~1--- rr 6 --- J --- --- C)) --- c~9 o I-u U uj</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Quality control method of specimen analysis system and specimen analysis system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T21%3A47%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Wakamiya,%20Yuji&rft.date=2022-09-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU2022201245A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true