X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS

An X-ray fluorescence analyzer is disclosed comprising an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first cryst...

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Bibliographische Detailangaben
Hauptverfasser:	KOSKINEN, Tommi, PELLI, Antti, SIPILA, Heikki
Format:	Patent
Sprache:	eng
Schlagworte:	CHEMISTRY FERROUS OR NON-FERROUS ALLOYS GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLIDMATERIALS OR FLUIDS MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING METALLURGY NUCLEAR ENGINEERING NUCLEAR PHYSICS PERFORMING OPERATIONS PHYSICS PRETREATMENT OF RAW MATERIALS PRODUCTION AND REFINING OF METALS SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATICTABLES OR JIGS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING TRANSPORTING TREATMENT OF ALLOYS OR NON-FERROUS METALS
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Beschreibung
Zusammenfassung:	An X-ray fluorescence analyzer is disclosed comprising an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) extends in a first direction from said slurry handling unit (201), and is configured to separate a predefined first wavelength range from fluorescent X-rays (207) and direct the fluorescent X rays to a first radiation detector (602, 1505). The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603, 802, 804) that has a diffractive surface (801, 803, 805), which is a simply connected surface. Said first radiation detector (602) is a solid-state semiconductor detector. (FIG. 8) 303__ --- 40650 Fig. 4 FFig.6