Method of determining an interface height of an interface between an upper and a lower layer comprised in a thickener

A Method of determining an interface height (h) of an interface (1) between an upper layer (3) and a lower layer (5) comprised in a container (7) of a thickener (9), wherein said thickener (9) is designed to perform a thickening process, wherein particles suspended in a medium supplied to the contai...

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Hauptverfasser:	MCKERTICH, Taylor, BRENZINGER, Matthias, CADIZ, Nicolas, GHEEWALA, Jenish, NAIDOO, Dhiren, VAISSIERE, Dimitri
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TESTING
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creator	MCKERTICH, Taylor BRENZINGER, Matthias CADIZ, Nicolas GHEEWALA, Jenish NAIDOO, Dhiren VAISSIERE, Dimitri
description	A Method of determining an interface height (h) of an interface (1) between an upper layer (3) and a lower layer (5) comprised in a container (7) of a thickener (9), wherein said thickener (9) is designed to perform a thickening process, wherein particles suspended in a medium supplied to the container (7) are separated from a liquid comprised in the medium, and wherein said upper layer (3) comprises said liquid floating on said lower layer (5) comprising said particles, is described, which improves the availability of the determination of the interface height. This method comprises the method steps of: measuring said interface height (h) with an interface level measurement device (L) installed on said thickener (9) during time periods, when conditions prevailing at said thickener (9) permit performance of these measurements, with a group of measurement devices installed on said thickener (9) measuring process variables (v
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This method comprises the method steps of: measuring said interface height (h) with an interface level measurement device (L) installed on said thickener (9) during time periods, when conditions prevailing at said thickener (9) permit performance of these measurements, with a group of measurement devices installed on said thickener (9) measuring process variables (v</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; MEASURING ; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL ; METERING BY VOLUME ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220120&DB=EPODOC&CC=AU&NR=2020309708A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220120&DB=EPODOC&CC=AU&NR=2020309708A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MCKERTICH, Taylor</creatorcontrib><creatorcontrib>BRENZINGER, Matthias</creatorcontrib><creatorcontrib>CADIZ, Nicolas</creatorcontrib><creatorcontrib>GHEEWALA, Jenish</creatorcontrib><creatorcontrib>NAIDOO, Dhiren</creatorcontrib><creatorcontrib>VAISSIERE, Dimitri</creatorcontrib><title>Method of determining an interface height of an interface between an upper and a lower layer comprised in a thickener</title><description>A Method of determining an interface height (h) of an interface (1) between an upper layer (3) and a lower layer (5) comprised in a container (7) of a thickener (9), wherein said thickener (9) is designed to perform a thickening process, wherein particles suspended in a medium supplied to the container (7) are separated from a liquid comprised in the medium, and wherein said upper layer (3) comprises said liquid floating on said lower layer (5) comprising said particles, is described, which improves the availability of the determination of the interface height. 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This method comprises the method steps of: measuring said interface height (h) with an interface level measurement device (L) installed on said thickener (9) during time periods, when conditions prevailing at said thickener (9) permit performance of these measurements, with a group of measurement devices installed on said thickener (9) measuring process variables (v</abstract><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TESTING
title	Method of determining an interface height of an interface between an upper and a lower layer comprised in a thickener
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