Sensor module for multiparametrically analysing a medium
The invention relates to a sensor module (1) for multiparametrically analysing a medium (105) and to the uses thereof. The sensor module (1) according to the invention is distinguished by a combination of photonic and non-photonic measurement principles with parameter-sensitive coatings (103) on a s...
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| creator | LAU, Matthias |
| description | The invention relates to a sensor module (1) for multiparametrically analysing a medium (105) and to the uses thereof. The sensor module (1) according to the invention is distinguished by a combination of photonic and non-photonic measurement principles with parameter-sensitive coatings (103) on a substrate (100). In this case, a plurality of properties of a medium (105) can be captured over wide parameter ranges, wherein it is possible to use the method which is most suitable for the particular parameter at least regarding, for example, the accuracy, the long-term stability, the resolution, the reproducibility, the energy consumption, the manufacturing costs, the necessary space requirement. |
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The sensor module (1) according to the invention is distinguished by a combination of photonic and non-photonic measurement principles with parameter-sensitive coatings (103) on a substrate (100). In this case, a plurality of properties of a medium (105) can be captured over wide parameter ranges, wherein it is possible to use the method which is most suitable for the particular parameter at least regarding, for example, the accuracy, the long-term stability, the resolution, the reproducibility, the energy consumption, the manufacturing costs, the necessary space requirement.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220120&DB=EPODOC&CC=AU&NR=2020305383A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220120&DB=EPODOC&CC=AU&NR=2020305383A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LAU, Matthias</creatorcontrib><title>Sensor module for multiparametrically analysing a medium</title><description>The invention relates to a sensor module (1) for multiparametrically analysing a medium (105) and to the uses thereof. The sensor module (1) according to the invention is distinguished by a combination of photonic and non-photonic measurement principles with parameter-sensitive coatings (103) on a substrate (100). In this case, a plurality of properties of a medium (105) can be captured over wide parameter ranges, wherein it is possible to use the method which is most suitable for the particular parameter at least regarding, for example, the accuracy, the long-term stability, the resolution, the reproducibility, the energy consumption, the manufacturing costs, the necessary space requirement.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAITs0rzi9SyM1PKc1JVUgDMUtzSjILEosSc1NLijKTE3NyKhUS8xJzKosz89IVEhVyU1MyS3N5GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakm8Y6iRgZGBsYGpsYWxo6ExcaoAAYUvlw</recordid><startdate>20220120</startdate><enddate>20220120</enddate><creator>LAU, Matthias</creator><scope>EVB</scope></search><sort><creationdate>20220120</creationdate><title>Sensor module for multiparametrically analysing a medium</title><author>LAU, Matthias</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU2020305383A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LAU, Matthias</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LAU, Matthias</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sensor module for multiparametrically analysing a medium</title><date>2022-01-20</date><risdate>2022</risdate><abstract>The invention relates to a sensor module (1) for multiparametrically analysing a medium (105) and to the uses thereof. The sensor module (1) according to the invention is distinguished by a combination of photonic and non-photonic measurement principles with parameter-sensitive coatings (103) on a substrate (100). In this case, a plurality of properties of a medium (105) can be captured over wide parameter ranges, wherein it is possible to use the method which is most suitable for the particular parameter at least regarding, for example, the accuracy, the long-term stability, the resolution, the reproducibility, the energy consumption, the manufacturing costs, the necessary space requirement.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Sensor module for multiparametrically analysing a medium |
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