Analyte collecting device, and analyte collecting method and analyte inspection system using same

Analyte collecting device, and analyte collecting method and analyte inspection system using same

The present invention relates to an analyte collecting device, and an analyte collecting method and an analyte inspection system using same. Specifically, an embodiment of the present invention may provide an analyte collecting device, and an analyte collecting method and an analyte inspection syste...

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Hauptverfasser: JUNG, Yeoncheol, LEE, Su-Bong, KOH, Ghun
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator JUNG, Yeoncheol
LEE, Su-Bong
KOH, Ghun
description The present invention relates to an analyte collecting device, and an analyte collecting method and an analyte inspection system using same. Specifically, an embodiment of the present invention may provide an analyte collecting device, and an analyte collecting method and an analyte inspection system using same, the analyte collecting device comprising: a case including an opening and an inner space; and a piston which includes at least one partition wall for dividing the inner space into multiple inner spaces and is provided to be inserted in the inner space through the opening of the case and be then reciprocally movable therein.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Analyte collecting device, and analyte collecting method and analyte inspection system using same
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