System and method for characterizing properties of EM signals
A method and system are presented for determining properties of an electromagnetic waveform. The method comprises: providing measured parametric EM field data indicative of measured vector components of electric and magnetic fields of an EM waveform measured in at least one instance of time; providi...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!