Method for calibrating an augmented reality device
A method for calibrating a device having a first sensor and a second sensor. The method includes capturing sensor data using the first sensor and the second sensor. The device maintains a calibration profile including a translation parameter and a rotation parameter to model a spatial relationship b...
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| creator | HUANG, Lei CHI, Yu-Tseh STRELOW, Dennis William GROSSMAN, Etienne Gregoire BOUGUET, Jean-Yves HARMAT, Adam SHARMA, Divya LEVINE, Evan Gregory SWAMINATHAN, Ashwin |
| description | A method for calibrating a device having a first sensor and a second sensor. The method includes capturing sensor data using the first sensor and the second sensor. The device maintains a calibration profile including a translation parameter and a rotation parameter to model a spatial relationship between the first sensor and the second sensor. The method also includes determining a first calibration level associated with the calibration profile at a first time. The method further includes determining, based on the first calibration level, to perform a calibration process. The method further includes performing the calibration process at the first time by generating one or both of a calibrated translation parameter and a calibrated rotation parameter and replacing one or both of the translation parameter and the rotation parameter with one or both of the calibrated translation parameter and the calibrated rotation parameter. |
| format | Patent |
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The method further includes performing the calibration process at the first time by generating one or both of a calibrated translation parameter and a calibrated rotation parameter and replacing one or both of the translation parameter and the rotation parameter with one or both of the calibrated translation parameter and the calibrated rotation parameter.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200604&DB=EPODOC&CC=AU&NR=2018389234A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200604&DB=EPODOC&CC=AU&NR=2018389234A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG, Lei</creatorcontrib><creatorcontrib>CHI, Yu-Tseh</creatorcontrib><creatorcontrib>STRELOW, Dennis William</creatorcontrib><creatorcontrib>GROSSMAN, Etienne Gregoire</creatorcontrib><creatorcontrib>BOUGUET, Jean-Yves</creatorcontrib><creatorcontrib>HARMAT, Adam</creatorcontrib><creatorcontrib>SHARMA, Divya</creatorcontrib><creatorcontrib>LEVINE, Evan Gregory</creatorcontrib><creatorcontrib>SWAMINATHAN, Ashwin</creatorcontrib><title>Method for calibrating an augmented reality device</title><description>A method for calibrating a device having a first sensor and a second sensor. 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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Method for calibrating an augmented reality device |
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