Modeling trends in crop yields

A method and system for modeling trends in crop yields is provided. In an embodiment, the method comprises receiving, over a computer network, electronic digital data comprising yield data representing crop yields harvested from a plurality of agricultural fields and at a plurality of time points; i...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Andrejko, Erik, Aldor-Noiman, Sivan
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!