Assay apparatuses, methods and reagents
Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format. A method is provided for focusing an optical sensor to a spaced apart...
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| creator | LE, D. T SIGAL, GEORGE KOVACS, SANDOR WILLOUGHBY, JON CLINTON, CHARLES M GLEZER, ELI N TABAKIN, LEO KOCHAR, MANISH CHAMBERLIN, IAN JEFFREY-COKER, BANDELE LEIMKUEHLER, AARON |
| description | Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format. A method is provided for focusing an optical sensor to a spaced apart platform comprising the steps of: providing at least a higher, middle and lower patterned surface, wherein the middle patterned surface and the platform are aligned to each other and wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal; obtaining a first difference in contrast values between the higher and middle patterned surfaces with the optical sensor; obtaining a second difference in contrast values between the middle and lower patterned surfaces with the optical sensor; and comparing the first and second differences in contrast values. |
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A method is provided for focusing an optical sensor to a spaced apart platform comprising the steps of: providing at least a higher, middle and lower patterned surface, wherein the middle patterned surface and the platform are aligned to each other and wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal; obtaining a first difference in contrast values between the higher and middle patterned surfaces with the optical sensor; obtaining a second difference in contrast values between the middle and lower patterned surfaces with the optical sensor; and comparing the first and second differences in contrast values.</description><language>eng</language><subject>CHEMISTRY ; COLORIMETRY ; COMBINATORIAL CHEMISTRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; METALLURGY ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150716&DB=EPODOC&CC=AU&NR=2014203992A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150716&DB=EPODOC&CC=AU&NR=2014203992A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LE, D. 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A method is provided for focusing an optical sensor to a spaced apart platform comprising the steps of: providing at least a higher, middle and lower patterned surface, wherein the middle patterned surface and the platform are aligned to each other and wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal; obtaining a first difference in contrast values between the higher and middle patterned surfaces with the optical sensor; obtaining a second difference in contrast values between the middle and lower patterned surfaces with the optical sensor; and comparing the first and second differences in contrast values.</description><subject>CHEMISTRY</subject><subject>COLORIMETRY</subject><subject>COMBINATORIAL CHEMISTRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB3LC5OrFRILChILEosKS1OLdZRyE0tychPKVZIzEtRKEpNTE_NKynmYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxjqFGBoYmRgbGlpZGjobGxKkCADkdKLQ</recordid><startdate>20150716</startdate><enddate>20150716</enddate><creator>LE, D. 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T</au><au>SIGAL, GEORGE</au><au>KOVACS, SANDOR</au><au>WILLOUGHBY, JON</au><au>CLINTON, CHARLES M</au><au>GLEZER, ELI N</au><au>TABAKIN, LEO</au><au>KOCHAR, MANISH</au><au>CHAMBERLIN, IAN</au><au>JEFFREY-COKER, BANDELE</au><au>LEIMKUEHLER, AARON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Assay apparatuses, methods and reagents</title><date>2015-07-16</date><risdate>2015</risdate><abstract>Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format. A method is provided for focusing an optical sensor to a spaced apart platform comprising the steps of: providing at least a higher, middle and lower patterned surface, wherein the middle patterned surface and the platform are aligned to each other and wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal; obtaining a first difference in contrast values between the higher and middle patterned surfaces with the optical sensor; obtaining a second difference in contrast values between the middle and lower patterned surfaces with the optical sensor; and comparing the first and second differences in contrast values.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CHEMISTRY COLORIMETRY COMBINATORIAL CHEMISTRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING METALLURGY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING |
| title | Assay apparatuses, methods and reagents |
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