Direct sample analysis ion source

Direct sample analysis ion source

A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other...

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1. Verfasser: WHITEHOUSE, CRAIG M
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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creator WHITEHOUSE, CRAIG M
description A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU2012261885A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU2012261885A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU2012261885A13</originalsourceid><addsrcrecordid>eNrjZFB0ySxKTS5RKE7MLchJVUjMS8ypLM4sVsjMz1Mozi8tSk7lYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxjqFGBoZGRmaGFhamjobGxKkCABMyJnY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Direct sample analysis ion source</title><source>esp@cenet</source><creator>WHITEHOUSE, CRAIG M</creator><creatorcontrib>WHITEHOUSE, CRAIG M</creatorcontrib><description>A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131212&amp;DB=EPODOC&amp;CC=AU&amp;NR=2012261885A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131212&amp;DB=EPODOC&amp;CC=AU&amp;NR=2012261885A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WHITEHOUSE, CRAIG M</creatorcontrib><title>Direct sample analysis ion source</title><description>A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB0ySxKTS5RKE7MLchJVUjMS8ypLM4sVsjMz1Mozi8tSk7lYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxjqFGBoZGRmaGFhamjobGxKkCABMyJnY</recordid><startdate>20131212</startdate><enddate>20131212</enddate><creator>WHITEHOUSE, CRAIG M</creator><scope>EVB</scope></search><sort><creationdate>20131212</creationdate><title>Direct sample analysis ion source</title><author>WHITEHOUSE, CRAIG M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU2012261885A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>WHITEHOUSE, CRAIG M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WHITEHOUSE, CRAIG M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Direct sample analysis ion source</title><date>2013-12-12</date><risdate>2013</risdate><abstract>A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title Direct sample analysis ion source
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T03%3A57%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WHITEHOUSE,%20CRAIG%20M&rft.date=2013-12-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU2012261885A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true