Method and apparatus for three dimensional image processing and analysis
An image analysis apparatus (10) including first and second image capture devices( 18) and (20), each image capture device (18) and (20) having a field of view which includes an image detection zone (23); at least one light source (24) adapted to generate a series of parallel lines onto the image de...
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| creator | STEPHENS, PETER DAVEKUMAR |
| description | An image analysis apparatus (10) including first and second image capture devices( 18) and (20), each image capture device (18) and (20) having a field of view which includes an image detection zone (23); at least one light source (24) adapted to generate a series of parallel lines onto the image detection zone (23); positioning means (14) for locating an object (12) to be analysed in the image detection zone (23); processing means (11) adapted to cause the first and second image capture devices (18) and (20) to capture first and second images of the image detection zone (23), the first and second images comprised of the parallel lines as distorted by the object (12) located in the image detection zone (23), wherein the processing means (11) is further adapted to analyse the lines of the first and second captured images to establish the extent to which each parallel line has been distorted by the object (12), and the processing means (11) further adapted to establish at least one characteristic of the object (11) by analysis of the extent to which the parallel lines have been distorted. |
| format | Patent |
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at least one light source (24) adapted to generate a series of parallel lines onto the image detection zone (23); positioning means (14) for locating an object (12) to be analysed in the image detection zone (23); processing means (11) adapted to cause the first and second image capture devices (18) and (20) to capture first and second images of the image detection zone (23), the first and second images comprised of the parallel lines as distorted by the object (12) located in the image detection zone (23), wherein the processing means (11) is further adapted to analyse the lines of the first and second captured images to establish the extent to which each parallel line has been distorted by the object (12), and the processing means (11) further adapted to establish at least one characteristic of the object (11) by analysis of the extent to which the parallel lines have been distorted.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; 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at least one light source (24) adapted to generate a series of parallel lines onto the image detection zone (23); positioning means (14) for locating an object (12) to be analysed in the image detection zone (23); processing means (11) adapted to cause the first and second image capture devices (18) and (20) to capture first and second images of the image detection zone (23), the first and second images comprised of the parallel lines as distorted by the object (12) located in the image detection zone (23), wherein the processing means (11) is further adapted to analyse the lines of the first and second captured images to establish the extent to which each parallel line has been distorted by the object (12), and the processing means (11) further adapted to establish at least one characteristic of the object (11) by analysis of the extent to which the parallel lines have been distorted.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDwTS3JyE9RSMwD4oKCxKLEktJihbT8IoWSjKLUVIWUzNzUvOLM_LzEHIXM3MT0VIWCovzk1OLizLx0iCagTGVxZjEPA2taYk5xKi-U5mZQcXMNcfbQTS3Ij08tLkhMTs1LLYl3DDUyMLAwMjE2s7BwcjIyJlIZAPAxNek</recordid><startdate>20131212</startdate><enddate>20131212</enddate><creator>STEPHENS, PETER DAVEKUMAR</creator><scope>EVB</scope></search><sort><creationdate>20131212</creationdate><title>Method and apparatus for three dimensional image processing and analysis</title><author>STEPHENS, PETER DAVEKUMAR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU2008243688BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>STEPHENS, PETER DAVEKUMAR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STEPHENS, PETER DAVEKUMAR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for three dimensional image processing and analysis</title><date>2013-12-12</date><risdate>2013</risdate><abstract>An image analysis apparatus (10) including first and second image capture devices( 18) and (20), each image capture device (18) and (20) having a field of view which includes an image detection zone (23); 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| language | eng |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Method and apparatus for three dimensional image processing and analysis |
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