METHOD AND APPARATUS FOR BILAYER PHOTORESIST DRY DEVELOPMENT

A method for etching an organic anti-reflective coating (ARC) layer on a substrate in a plasma processing system comprising: introducing a process gas comprising nitrogen (N), hydrogen (H), and oxygen (O); forming a plasma from the process gas; and exposing the substrate to the plasma. The process g...

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Bibliographische Detailangaben
Hauptverfasser: KOICHIRO INAZAWA, MASAAKI HAGIHARA, KIMIHIRO HIGUCHI, VAIDYANATHAN BALASUBRAMANIAM, RALPH KIM, PHILIP SANSONE, YOSHIKI IGARASHI, EIICHI NISHIMURA
Format: Patent
Sprache:eng
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