Method of manufacturing an accelerometer

Devices fabricated on a wafer are encapsulated by forming a pattern of bond rings on a cap wafer and aligning and bonding the two wafers together, under thermo-compression, so that an operational part (22) of each device (20) is surrounded by a respective bond ring (21). The bond ring provides a her...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KIM PONG DANIEL CHIR, SOORIAKUMAR KATHIRGAMASUNDARAM, KITT WAI KOK, KEITH PATMON BRYAN, WAI MUN CHONG
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KIM PONG DANIEL CHIR
SOORIAKUMAR KATHIRGAMASUNDARAM
KITT WAI KOK
KEITH PATMON BRYAN
WAI MUN CHONG
description Devices fabricated on a wafer are encapsulated by forming a pattern of bond rings on a cap wafer and aligning and bonding the two wafers together, under thermo-compression, so that an operational part (22) of each device (20) is surrounded by a respective bond ring (21). The bond ring provides a hermetic seal by occupying any trenches (25) or other discontinuities, such as conductive tracks (23), in the upper surface of the device crossed by the ring. An accelerometer is manufactured by etching at least one cavity (5) into the top side of a substrate (1), bonding an intermediate layer of material (6) onto the top side of the substrate, depositing metallization (7) onto the intermediate layer and etching the metallization and intermediate layer to form a sensor structure suspended over each cavity. Conductive tracks (31, 32) of a lower metallization layer deposited on the substrate (30) cross under tracks (37, 38) deposited on the upper side of the intermediate layer (35, 36) without making electrical connection. Bridges are fabricated by forming cavities (33, 34) on the underside of the intermediate layer to accommodate the lower track.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_AU2003216030A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AU2003216030A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_AU2003216030A13</originalsourceid><addsrcrecordid>eNrjZNDwTS3JyE9RyE9TyE3MK01LTC4pLcrMS1dIzFNITE5OzUktys9NLUkt4mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8Y6hRgYGxkaGZgbGBo6GxsSpAgBwsykV</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of manufacturing an accelerometer</title><source>esp@cenet</source><creator>KIM PONG DANIEL CHIR ; SOORIAKUMAR KATHIRGAMASUNDARAM ; KITT WAI KOK ; KEITH PATMON BRYAN ; WAI MUN CHONG</creator><creatorcontrib>KIM PONG DANIEL CHIR ; SOORIAKUMAR KATHIRGAMASUNDARAM ; KITT WAI KOK ; KEITH PATMON BRYAN ; WAI MUN CHONG</creatorcontrib><description>Devices fabricated on a wafer are encapsulated by forming a pattern of bond rings on a cap wafer and aligning and bonding the two wafers together, under thermo-compression, so that an operational part (22) of each device (20) is surrounded by a respective bond ring (21). The bond ring provides a hermetic seal by occupying any trenches (25) or other discontinuities, such as conductive tracks (23), in the upper surface of the device crossed by the ring. An accelerometer is manufactured by etching at least one cavity (5) into the top side of a substrate (1), bonding an intermediate layer of material (6) onto the top side of the substrate, depositing metallization (7) onto the intermediate layer and etching the metallization and intermediate layer to form a sensor structure suspended over each cavity. Conductive tracks (31, 32) of a lower metallization layer deposited on the substrate (30) cross under tracks (37, 38) deposited on the upper side of the intermediate layer (35, 36) without making electrical connection. Bridges are fabricated by forming cavities (33, 34) on the underside of the intermediate layer to accommodate the lower track.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT ; MEASURING ; MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK ; MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES ; MICROSTRUCTURAL TECHNOLOGY ; PERFORMING OPERATIONS ; PHYSICS ; PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS ; SEMICONDUCTOR DEVICES ; TESTING ; TRANSPORTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030902&amp;DB=EPODOC&amp;CC=AU&amp;NR=2003216030A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20030902&amp;DB=EPODOC&amp;CC=AU&amp;NR=2003216030A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIM PONG DANIEL CHIR</creatorcontrib><creatorcontrib>SOORIAKUMAR KATHIRGAMASUNDARAM</creatorcontrib><creatorcontrib>KITT WAI KOK</creatorcontrib><creatorcontrib>KEITH PATMON BRYAN</creatorcontrib><creatorcontrib>WAI MUN CHONG</creatorcontrib><title>Method of manufacturing an accelerometer</title><description>Devices fabricated on a wafer are encapsulated by forming a pattern of bond rings on a cap wafer and aligning and bonding the two wafers together, under thermo-compression, so that an operational part (22) of each device (20) is surrounded by a respective bond ring (21). The bond ring provides a hermetic seal by occupying any trenches (25) or other discontinuities, such as conductive tracks (23), in the upper surface of the device crossed by the ring. An accelerometer is manufactured by etching at least one cavity (5) into the top side of a substrate (1), bonding an intermediate layer of material (6) onto the top side of the substrate, depositing metallization (7) onto the intermediate layer and etching the metallization and intermediate layer to form a sensor structure suspended over each cavity. Conductive tracks (31, 32) of a lower metallization layer deposited on the substrate (30) cross under tracks (37, 38) deposited on the upper side of the intermediate layer (35, 36) without making electrical connection. Bridges are fabricated by forming cavities (33, 34) on the underside of the intermediate layer to accommodate the lower track.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT</subject><subject>MEASURING</subject><subject>MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK</subject><subject>MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES</subject><subject>MICROSTRUCTURAL TECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDwTS3JyE9RyE9TyE3MK01LTC4pLcrMS1dIzFNITE5OzUktys9NLUkt4mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8Y6hRgYGxkaGZgbGBo6GxsSpAgBwsykV</recordid><startdate>20030902</startdate><enddate>20030902</enddate><creator>KIM PONG DANIEL CHIR</creator><creator>SOORIAKUMAR KATHIRGAMASUNDARAM</creator><creator>KITT WAI KOK</creator><creator>KEITH PATMON BRYAN</creator><creator>WAI MUN CHONG</creator><scope>EVB</scope></search><sort><creationdate>20030902</creationdate><title>Method of manufacturing an accelerometer</title><author>KIM PONG DANIEL CHIR ; SOORIAKUMAR KATHIRGAMASUNDARAM ; KITT WAI KOK ; KEITH PATMON BRYAN ; WAI MUN CHONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_AU2003216030A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT</topic><topic>MEASURING</topic><topic>MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK</topic><topic>MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES</topic><topic>MICROSTRUCTURAL TECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KIM PONG DANIEL CHIR</creatorcontrib><creatorcontrib>SOORIAKUMAR KATHIRGAMASUNDARAM</creatorcontrib><creatorcontrib>KITT WAI KOK</creatorcontrib><creatorcontrib>KEITH PATMON BRYAN</creatorcontrib><creatorcontrib>WAI MUN CHONG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIM PONG DANIEL CHIR</au><au>SOORIAKUMAR KATHIRGAMASUNDARAM</au><au>KITT WAI KOK</au><au>KEITH PATMON BRYAN</au><au>WAI MUN CHONG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of manufacturing an accelerometer</title><date>2003-09-02</date><risdate>2003</risdate><abstract>Devices fabricated on a wafer are encapsulated by forming a pattern of bond rings on a cap wafer and aligning and bonding the two wafers together, under thermo-compression, so that an operational part (22) of each device (20) is surrounded by a respective bond ring (21). The bond ring provides a hermetic seal by occupying any trenches (25) or other discontinuities, such as conductive tracks (23), in the upper surface of the device crossed by the ring. An accelerometer is manufactured by etching at least one cavity (5) into the top side of a substrate (1), bonding an intermediate layer of material (6) onto the top side of the substrate, depositing metallization (7) onto the intermediate layer and etching the metallization and intermediate layer to form a sensor structure suspended over each cavity. Conductive tracks (31, 32) of a lower metallization layer deposited on the substrate (30) cross under tracks (37, 38) deposited on the upper side of the intermediate layer (35, 36) without making electrical connection. Bridges are fabricated by forming cavities (33, 34) on the underside of the intermediate layer to accommodate the lower track.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_AU2003216030A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
MEASURING
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK
MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICALDEVICES
MICROSTRUCTURAL TECHNOLOGY
PERFORMING OPERATIONS
PHYSICS
PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
SEMICONDUCTOR DEVICES
TESTING
TRANSPORTING
title Method of manufacturing an accelerometer
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T19%3A26%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KIM%20PONG%20DANIEL%20CHIR&rft.date=2003-09-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EAU2003216030A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true