ELEKTRISCH AENDERBARE NICHTFLUECHTIGE SPEICHERANORDNUNG
In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM cell comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The othe...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | CHIU, TE-LONG VAN BUSKIRK, MICHAEL A SHUM, YING K NOLAN, JOSEPH G |
description | In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM cell comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The other terminal being labelled "T". The tunnel device causes charges to be stored or removed from the gate of the MOS transistor. In a preferred embodiment, a four-terminal EANOM cell is disclosed. The four terminals of the EANOM cell are terminals T, S (source of the MOS transistor), D (drain of the MOS transistor) and a terminal C which is capacitively coupled to the gate of the MOS transistor. The EANOM cell can be used in a memory circuit to increase the reliability thereof. Two or more EANOM cells are connected in tandem and operate simultaneously. Catastrophic failure of one EANOM cell results in an open circuit with the other EANOM cell continuing to function. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ATE74229TT1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ATE74229TT1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ATE74229TT13</originalsourceid><addsrcrecordid>eNrjZDB39XH1DgnyDHb2UHB09XNxDXJyDHJV8PN09ghx8wl1BVKe7q4KwQGuQBHXIEc__yAXv1A_dx4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu8Y4mpuYmRkGRJiaEyEEgAg0ii6</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELEKTRISCH AENDERBARE NICHTFLUECHTIGE SPEICHERANORDNUNG</title><source>esp@cenet</source><creator>CHIU, TE-LONG ; VAN BUSKIRK, MICHAEL A ; SHUM, YING K ; NOLAN, JOSEPH G</creator><creatorcontrib>CHIU, TE-LONG ; VAN BUSKIRK, MICHAEL A ; SHUM, YING K ; NOLAN, JOSEPH G</creatorcontrib><description>In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM cell comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The other terminal being labelled "T". The tunnel device causes charges to be stored or removed from the gate of the MOS transistor. In a preferred embodiment, a four-terminal EANOM cell is disclosed. The four terminals of the EANOM cell are terminals T, S (source of the MOS transistor), D (drain of the MOS transistor) and a terminal C which is capacitively coupled to the gate of the MOS transistor. The EANOM cell can be used in a memory circuit to increase the reliability thereof. Two or more EANOM cells are connected in tandem and operate simultaneously. Catastrophic failure of one EANOM cell results in an open circuit with the other EANOM cell continuing to function.</description><edition>5</edition><language>eng ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INFORMATION STORAGE ; PHYSICS ; SEMICONDUCTOR DEVICES ; STATIC STORES</subject><creationdate>1992</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19920415&DB=EPODOC&CC=AT&NR=E74229T1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19920415&DB=EPODOC&CC=AT&NR=E74229T1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHIU, TE-LONG</creatorcontrib><creatorcontrib>VAN BUSKIRK, MICHAEL A</creatorcontrib><creatorcontrib>SHUM, YING K</creatorcontrib><creatorcontrib>NOLAN, JOSEPH G</creatorcontrib><title>ELEKTRISCH AENDERBARE NICHTFLUECHTIGE SPEICHERANORDNUNG</title><description>In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM cell comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The other terminal being labelled "T". The tunnel device causes charges to be stored or removed from the gate of the MOS transistor. In a preferred embodiment, a four-terminal EANOM cell is disclosed. The four terminals of the EANOM cell are terminals T, S (source of the MOS transistor), D (drain of the MOS transistor) and a terminal C which is capacitively coupled to the gate of the MOS transistor. The EANOM cell can be used in a memory circuit to increase the reliability thereof. Two or more EANOM cells are connected in tandem and operate simultaneously. Catastrophic failure of one EANOM cell results in an open circuit with the other EANOM cell continuing to function.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1992</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB39XH1DgnyDHb2UHB09XNxDXJyDHJV8PN09ghx8wl1BVKe7q4KwQGuQBHXIEc__yAXv1A_dx4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEu8Y4mpuYmRkGRJiaEyEEgAg0ii6</recordid><startdate>19920415</startdate><enddate>19920415</enddate><creator>CHIU, TE-LONG</creator><creator>VAN BUSKIRK, MICHAEL A</creator><creator>SHUM, YING K</creator><creator>NOLAN, JOSEPH G</creator><scope>EVB</scope></search><sort><creationdate>19920415</creationdate><title>ELEKTRISCH AENDERBARE NICHTFLUECHTIGE SPEICHERANORDNUNG</title><author>CHIU, TE-LONG ; VAN BUSKIRK, MICHAEL A ; SHUM, YING K ; NOLAN, JOSEPH G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ATE74229TT13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; ger</language><creationdate>1992</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>CHIU, TE-LONG</creatorcontrib><creatorcontrib>VAN BUSKIRK, MICHAEL A</creatorcontrib><creatorcontrib>SHUM, YING K</creatorcontrib><creatorcontrib>NOLAN, JOSEPH G</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHIU, TE-LONG</au><au>VAN BUSKIRK, MICHAEL A</au><au>SHUM, YING K</au><au>NOLAN, JOSEPH G</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELEKTRISCH AENDERBARE NICHTFLUECHTIGE SPEICHERANORDNUNG</title><date>1992-04-15</date><risdate>1992</risdate><abstract>In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM cell comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The other terminal being labelled "T". The tunnel device causes charges to be stored or removed from the gate of the MOS transistor. In a preferred embodiment, a four-terminal EANOM cell is disclosed. The four terminals of the EANOM cell are terminals T, S (source of the MOS transistor), D (drain of the MOS transistor) and a terminal C which is capacitively coupled to the gate of the MOS transistor. The EANOM cell can be used in a memory circuit to increase the reliability thereof. Two or more EANOM cells are connected in tandem and operate simultaneously. Catastrophic failure of one EANOM cell results in an open circuit with the other EANOM cell continuing to function.</abstract><edition>5</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; ger |
recordid | cdi_epo_espacenet_ATE74229TT1 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INFORMATION STORAGE PHYSICS SEMICONDUCTOR DEVICES STATIC STORES |
title | ELEKTRISCH AENDERBARE NICHTFLUECHTIGE SPEICHERANORDNUNG |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T09%3A00%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHIU,%20TE-LONG&rft.date=1992-04-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EATE74229TT1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |