VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER

VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER

In a method for calibrating a multi-bit DAC, particularly for application in high-speed and high-resolution ADCs, such as SIGMA DELTA ADCs, and comprising a number of DAC cells, apart from the number of DAC cells applied in the multi-bit DAC for conversion, an additional DAC cell is provided, which...

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Hauptverfasser: BREEMS, LUCIEN, BAJDECHI, OVIDIU
Format: Patent
Sprache:ger
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BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
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BAJDECHI, OVIDIU
description In a method for calibrating a multi-bit DAC, particularly for application in high-speed and high-resolution ADCs, such as SIGMA DELTA ADCs, and comprising a number of DAC cells, apart from the number of DAC cells applied in the multi-bit DAC for conversion, an additional DAC cell is provided, which can be interchanged with each of the other DAC cells in order to switch each DAC cell successively from the multi-bit DAC into a calibration circuit to calibrate said DAC cell without interrupting the conversion. The calibration circuit includes means for measuring errors in the DAC cell under calibration and means for correcting said DAC cell.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ATE417408TT1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ATE417408TT1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ATE417408TT13</originalsourceid><addsrcrecordid>eNqNjbEKwkAQRNNYiPoPa5-gYkDbjbdJFnMn3G0UbILIWYkG9G_9GaMYBRuthhkeb7rBbU02xdySgW2pYYkFJ5bp0YkNOdCU24QlAsUZCxYjNFissqjUjmRL1oVv5IuAFgmBDSjSjYJco_xcoslog0YJbNiqEEqjQLM8rzW4VbHIG-qXH7B0GTlBEZKmtns_6Bx2x4sfvLIXDFOSRR75-lz5S73b-5O_VigUT2bxeC4ymf7D3AFUQFXm</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER</title><source>esp@cenet</source><creator>BREEMS, LUCIEN ; BAJDECHI, OVIDIU</creator><creatorcontrib>BREEMS, LUCIEN ; BAJDECHI, OVIDIU</creatorcontrib><description>In a method for calibrating a multi-bit DAC, particularly for application in high-speed and high-resolution ADCs, such as SIGMA DELTA ADCs, and comprising a number of DAC cells, apart from the number of DAC cells applied in the multi-bit DAC for conversion, an additional DAC cell is provided, which can be interchanged with each of the other DAC cells in order to switch each DAC cell successively from the multi-bit DAC into a calibration circuit to calibrate said DAC cell without interrupting the conversion. The calibration circuit includes means for measuring errors in the DAC cell under calibration and means for correcting said DAC cell.</description><language>ger</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081215&amp;DB=EPODOC&amp;CC=AT&amp;NR=E417408T1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081215&amp;DB=EPODOC&amp;CC=AT&amp;NR=E417408T1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BREEMS, LUCIEN</creatorcontrib><creatorcontrib>BAJDECHI, OVIDIU</creatorcontrib><title>VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER</title><description>In a method for calibrating a multi-bit DAC, particularly for application in high-speed and high-resolution ADCs, such as SIGMA DELTA ADCs, and comprising a number of DAC cells, apart from the number of DAC cells applied in the multi-bit DAC for conversion, an additional DAC cell is provided, which can be interchanged with each of the other DAC cells in order to switch each DAC cell successively from the multi-bit DAC into a calibration circuit to calibrate said DAC cell without interrupting the conversion. The calibration circuit includes means for measuring errors in the DAC cell under calibration and means for correcting said DAC cell.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjbEKwkAQRNNYiPoPa5-gYkDbjbdJFnMn3G0UbILIWYkG9G_9GaMYBRuthhkeb7rBbU02xdySgW2pYYkFJ5bp0YkNOdCU24QlAsUZCxYjNFissqjUjmRL1oVv5IuAFgmBDSjSjYJco_xcoslog0YJbNiqEEqjQLM8rzW4VbHIG-qXH7B0GTlBEZKmtns_6Bx2x4sfvLIXDFOSRR75-lz5S73b-5O_VigUT2bxeC4ymf7D3AFUQFXm</recordid><startdate>20081215</startdate><enddate>20081215</enddate><creator>BREEMS, LUCIEN</creator><creator>BAJDECHI, OVIDIU</creator><scope>EVB</scope></search><sort><creationdate>20081215</creationdate><title>VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER</title><author>BREEMS, LUCIEN ; BAJDECHI, OVIDIU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ATE417408TT13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>2008</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>BREEMS, LUCIEN</creatorcontrib><creatorcontrib>BAJDECHI, OVIDIU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BREEMS, LUCIEN</au><au>BAJDECHI, OVIDIU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER</title><date>2008-12-15</date><risdate>2008</risdate><abstract>In a method for calibrating a multi-bit DAC, particularly for application in high-speed and high-resolution ADCs, such as SIGMA DELTA ADCs, and comprising a number of DAC cells, apart from the number of DAC cells applied in the multi-bit DAC for conversion, an additional DAC cell is provided, which can be interchanged with each of the other DAC cells in order to switch each DAC cell successively from the multi-bit DAC into a calibration circuit to calibrate said DAC cell without interrupting the conversion. The calibration circuit includes means for measuring errors in the DAC cell under calibration and means for correcting said DAC cell.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
title VERFAHREN ZUM KALIBRIEREN EINES MEHRBIT- DIGITAL/ANALOG-UMSETZERS, MEHRBIT-DIGITAL/ANALOG- UMSETZER, IN DEM DIESES VERFAHREN ANGEWANDT WIRD, UND MIT EINEM SOLCHEN MEHRBIT-DIGITAL/ANALOG- UMSETZER AUSGESTATTETER UMSETZER
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T20%3A52%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BREEMS,%20LUCIEN&rft.date=2008-12-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EATE417408TT1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true