VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN
Process for identifying characters, which are formed on a plurality (2) of silicon sheets, whereby the sheets are arranged in parallel planes (P0) and are aligned relative to the support (1), and comprises: inserting luminous reflector (5) between a first (2a) and a second (2b) successive sheet of t...
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| creator | POLI, ALAIN POLI, BERNARD |
| description | Process for identifying characters, which are formed on a plurality (2) of silicon sheets, whereby the sheets are arranged in parallel planes (P0) and are aligned relative to the support (1), and comprises: inserting luminous reflector (5) between a first (2a) and a second (2b) successive sheet of the plurality of sheets starting from underneath the plurality of sheets; illuminating the characters, which are formed on the first sheet, via the intermediacy of a first incident luminous ray (R1) which is reflected by the luminous reflector and which are inserted between the first and the second successive sheets in such a way that the first incident luminous ray, which is reflected by part of the first sheet which is parallel to the parallel planes (P0), shall be directed in a direction which is different from the direction of the optical axis of observation (AO); observing the characters, which are being illuminated, of the first sheet in the direction of the optical axis, whereby the optical axis is rectilinear and arranged, at least in part, under the plurality of sheets. identifying the characters which are being observed. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ATE240561TT1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ATE240561TT1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ATE240561TT13</originalsourceid><addsrcrecordid>eNrjZAgOcw1yc_QIcvVTCPVzUXB3DTrcEqIQFeqr4Oni6hfi6eYZ5ekKkg3z91OIcvV09gCyHUPdFHxdgZpAEsGePkA1ob4BPkCdISB5HgbWtMSc4lReKM3NoOjmCpTRTS3Ij08tLkhMTs1LLYl3DHE1MjEwNTMMCTE0JkYNAO8SMkA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN</title><source>esp@cenet</source><creator>POLI, ALAIN ; POLI, BERNARD</creator><creatorcontrib>POLI, ALAIN ; POLI, BERNARD</creatorcontrib><description>Process for identifying characters, which are formed on a plurality (2) of silicon sheets, whereby the sheets are arranged in parallel planes (P0) and are aligned relative to the support (1), and comprises: inserting luminous reflector (5) between a first (2a) and a second (2b) successive sheet of the plurality of sheets starting from underneath the plurality of sheets; illuminating the characters, which are formed on the first sheet, via the intermediacy of a first incident luminous ray (R1) which is reflected by the luminous reflector and which are inserted between the first and the second successive sheets in such a way that the first incident luminous ray, which is reflected by part of the first sheet which is parallel to the parallel planes (P0), shall be directed in a direction which is different from the direction of the optical axis of observation (AO); observing the characters, which are being illuminated, of the first sheet in the direction of the optical axis, whereby the optical axis is rectilinear and arranged, at least in part, under the plurality of sheets. identifying the characters which are being observed.</description><edition>7</edition><language>ger</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030515&DB=EPODOC&CC=AT&NR=E240561T1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030515&DB=EPODOC&CC=AT&NR=E240561T1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>POLI, ALAIN</creatorcontrib><creatorcontrib>POLI, BERNARD</creatorcontrib><title>VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN</title><description>Process for identifying characters, which are formed on a plurality (2) of silicon sheets, whereby the sheets are arranged in parallel planes (P0) and are aligned relative to the support (1), and comprises: inserting luminous reflector (5) between a first (2a) and a second (2b) successive sheet of the plurality of sheets starting from underneath the plurality of sheets; illuminating the characters, which are formed on the first sheet, via the intermediacy of a first incident luminous ray (R1) which is reflected by the luminous reflector and which are inserted between the first and the second successive sheets in such a way that the first incident luminous ray, which is reflected by part of the first sheet which is parallel to the parallel planes (P0), shall be directed in a direction which is different from the direction of the optical axis of observation (AO); observing the characters, which are being illuminated, of the first sheet in the direction of the optical axis, whereby the optical axis is rectilinear and arranged, at least in part, under the plurality of sheets. identifying the characters which are being observed.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAgOcw1yc_QIcvVTCPVzUXB3DTrcEqIQFeqr4Oni6hfi6eYZ5ekKkg3z91OIcvV09gCyHUPdFHxdgZpAEsGePkA1ob4BPkCdISB5HgbWtMSc4lReKM3NoOjmCpTRTS3Ij08tLkhMTs1LLYl3DHE1MjEwNTMMCTE0JkYNAO8SMkA</recordid><startdate>20030515</startdate><enddate>20030515</enddate><creator>POLI, ALAIN</creator><creator>POLI, BERNARD</creator><scope>EVB</scope></search><sort><creationdate>20030515</creationdate><title>VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN</title><author>POLI, ALAIN ; POLI, BERNARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ATE240561TT13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>2003</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>POLI, ALAIN</creatorcontrib><creatorcontrib>POLI, BERNARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>POLI, ALAIN</au><au>POLI, BERNARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN</title><date>2003-05-15</date><risdate>2003</risdate><abstract>Process for identifying characters, which are formed on a plurality (2) of silicon sheets, whereby the sheets are arranged in parallel planes (P0) and are aligned relative to the support (1), and comprises: inserting luminous reflector (5) between a first (2a) and a second (2b) successive sheet of the plurality of sheets starting from underneath the plurality of sheets; illuminating the characters, which are formed on the first sheet, via the intermediacy of a first incident luminous ray (R1) which is reflected by the luminous reflector and which are inserted between the first and the second successive sheets in such a way that the first incident luminous ray, which is reflected by part of the first sheet which is parallel to the parallel planes (P0), shall be directed in a direction which is different from the direction of the optical axis of observation (AO); observing the characters, which are being illuminated, of the first sheet in the direction of the optical axis, whereby the optical axis is rectilinear and arranged, at least in part, under the plurality of sheets. identifying the characters which are being observed.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN |
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