ABTASTENDE MESSEINRICHTUNG

ABTASTENDE MESSEINRICHTUNG

A sampling type measuring device according to the present invention measures an analog input signal by performing sampling on the analog input signal, converting each value picked up by sampling into digital form, and processing the digital values. Exponential averaging calculation is performed dire...

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Hauptverfasser: KASHIWABARA, YUKIO, HIRAISHI, YUKIYOSHI, GOTO, EIICHI
Format: Patent
Sprache:ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator KASHIWABARA, YUKIO
HIRAISHI, YUKIYOSHI
GOTO, EIICHI
description A sampling type measuring device according to the present invention measures an analog input signal by performing sampling on the analog input signal, converting each value picked up by sampling into digital form, and processing the digital values. Exponential averaging calculation is performed directly on the digital values; therefore, no provision nor time is needed for regulating a sampling period, this shortening the time of measurement.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ATE140544TT1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ATE140544TT1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ATE140544TT13</originalsourceid><addsrcrecordid>eNrjZJBydApxDA5x9XNxVfB1DQ529fQL8nT2CAn1c-dhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGOIa6GJgamJiYhIYbGxKgBAFKxIPo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ABTASTENDE MESSEINRICHTUNG</title><source>esp@cenet</source><creator>KASHIWABARA, YUKIO ; HIRAISHI, YUKIYOSHI ; GOTO, EIICHI</creator><creatorcontrib>KASHIWABARA, YUKIO ; HIRAISHI, YUKIYOSHI ; GOTO, EIICHI</creatorcontrib><description>A sampling type measuring device according to the present invention measures an analog input signal by performing sampling on the analog input signal, converting each value picked up by sampling into digital form, and processing the digital values. Exponential averaging calculation is performed directly on the digital values; therefore, no provision nor time is needed for regulating a sampling period, this shortening the time of measurement.</description><edition>6</edition><language>ger</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1996</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19960815&amp;DB=EPODOC&amp;CC=AT&amp;NR=E140544T1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19960815&amp;DB=EPODOC&amp;CC=AT&amp;NR=E140544T1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KASHIWABARA, YUKIO</creatorcontrib><creatorcontrib>HIRAISHI, YUKIYOSHI</creatorcontrib><creatorcontrib>GOTO, EIICHI</creatorcontrib><title>ABTASTENDE MESSEINRICHTUNG</title><description>A sampling type measuring device according to the present invention measures an analog input signal by performing sampling on the analog input signal, converting each value picked up by sampling into digital form, and processing the digital values. Exponential averaging calculation is performed directly on the digital values; therefore, no provision nor time is needed for regulating a sampling period, this shortening the time of measurement.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1996</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBydApxDA5x9XNxVfB1DQ529fQL8nT2CAn1c-dhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGOIa6GJgamJiYhIYbGxKgBAFKxIPo</recordid><startdate>19960815</startdate><enddate>19960815</enddate><creator>KASHIWABARA, YUKIO</creator><creator>HIRAISHI, YUKIYOSHI</creator><creator>GOTO, EIICHI</creator><scope>EVB</scope></search><sort><creationdate>19960815</creationdate><title>ABTASTENDE MESSEINRICHTUNG</title><author>KASHIWABARA, YUKIO ; HIRAISHI, YUKIYOSHI ; GOTO, EIICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ATE140544TT13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>1996</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KASHIWABARA, YUKIO</creatorcontrib><creatorcontrib>HIRAISHI, YUKIYOSHI</creatorcontrib><creatorcontrib>GOTO, EIICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KASHIWABARA, YUKIO</au><au>HIRAISHI, YUKIYOSHI</au><au>GOTO, EIICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ABTASTENDE MESSEINRICHTUNG</title><date>1996-08-15</date><risdate>1996</risdate><abstract>A sampling type measuring device according to the present invention measures an analog input signal by performing sampling on the analog input signal, converting each value picked up by sampling into digital form, and processing the digital values. Exponential averaging calculation is performed directly on the digital values; therefore, no provision nor time is needed for regulating a sampling period, this shortening the time of measurement.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title ABTASTENDE MESSEINRICHTUNG
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T17%3A05%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KASHIWABARA,%20YUKIO&rft.date=1996-08-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EATE140544TT1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true