IONENSENSOR

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Hauptverfasser: KRAUSE CHRISTIAN, HUBER CHRISTIAN, LEINER MARCO JEAN PIERRE DR, WOLFBEIS OTTO S. DR, WERNER TOBIAS DR
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creator KRAUSE CHRISTIAN
HUBER CHRISTIAN
LEINER MARCO JEAN PIERRE DR
WOLFBEIS OTTO S. DR
WERNER TOBIAS DR
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ATA113898A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ATA113898A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ATA113898A3</originalsourceid><addsrcrecordid>eNrjZOD29Pdz9QsGIv8gHgbWtMSc4lReKM3NIO_mGuLsoZtakB-fWlyQmJyal1oS7xjiaGhobGFp4WhMWAUAHkgbpw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IONENSENSOR</title><source>esp@cenet</source><creator>KRAUSE CHRISTIAN ; HUBER CHRISTIAN ; LEINER MARCO JEAN PIERRE DR ; WOLFBEIS OTTO S. DR ; WERNER TOBIAS DR</creator><creatorcontrib>KRAUSE CHRISTIAN ; HUBER CHRISTIAN ; LEINER MARCO JEAN PIERRE DR ; WOLFBEIS OTTO S. DR ; WERNER TOBIAS DR</creatorcontrib><edition>7</edition><language>ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20021115&amp;DB=EPODOC&amp;CC=AT&amp;NR=A113898A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20021115&amp;DB=EPODOC&amp;CC=AT&amp;NR=A113898A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KRAUSE CHRISTIAN</creatorcontrib><creatorcontrib>HUBER CHRISTIAN</creatorcontrib><creatorcontrib>LEINER MARCO JEAN PIERRE DR</creatorcontrib><creatorcontrib>WOLFBEIS OTTO S. DR</creatorcontrib><creatorcontrib>WERNER TOBIAS DR</creatorcontrib><title>IONENSENSOR</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOD29Pdz9QsGIv8gHgbWtMSc4lReKM3NIO_mGuLsoZtakB-fWlyQmJyal1oS7xjiaGhobGFp4WhMWAUAHkgbpw</recordid><startdate>20021115</startdate><enddate>20021115</enddate><creator>KRAUSE CHRISTIAN</creator><creator>HUBER CHRISTIAN</creator><creator>LEINER MARCO JEAN PIERRE DR</creator><creator>WOLFBEIS OTTO S. DR</creator><creator>WERNER TOBIAS DR</creator><scope>EVB</scope></search><sort><creationdate>20021115</creationdate><title>IONENSENSOR</title><author>KRAUSE CHRISTIAN ; HUBER CHRISTIAN ; LEINER MARCO JEAN PIERRE DR ; WOLFBEIS OTTO S. DR ; WERNER TOBIAS DR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ATA113898A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ger</language><creationdate>2002</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KRAUSE CHRISTIAN</creatorcontrib><creatorcontrib>HUBER CHRISTIAN</creatorcontrib><creatorcontrib>LEINER MARCO JEAN PIERRE DR</creatorcontrib><creatorcontrib>WOLFBEIS OTTO S. DR</creatorcontrib><creatorcontrib>WERNER TOBIAS DR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KRAUSE CHRISTIAN</au><au>HUBER CHRISTIAN</au><au>LEINER MARCO JEAN PIERRE DR</au><au>WOLFBEIS OTTO S. DR</au><au>WERNER TOBIAS DR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IONENSENSOR</title><date>2002-11-15</date><risdate>2002</risdate><edition>7</edition><oa>free_for_read</oa></addata></record>
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language ger
recordid cdi_epo_espacenet_ATA113898A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title IONENSENSOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T02%3A06%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KRAUSE%20CHRISTIAN&rft.date=2002-11-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EATA113898A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true