A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach

In previous works of these authors, a technique for doing single-fault diagnosis in linear analog circuits was developed. Under certain conditions, one of them assuming nominal values for the circuit parameters, it was shown that only two measurements taken on two selected circuit nodes, at a single...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	VLSI design (Yverdon, Switzerland) Switzerland), 2008, Vol.2008 (2008), p.1-8
Hauptverfasser:	Soares Augusto, José A., Beltrán Almeida, Carlos
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!