Novel Test Fixture for Characterizing Microcontacts: Performance and Reliability

Engineers have attempted to improve reliability and lifecycle performance using novel micro-contact metals, unique mechanical designs and packaging. Contact resistance can evolve over the lifetime of the micro-switch by increasing until failure. This work shows the fabrication of micro-contact suppo...

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description Engineers have attempted to improve reliability and lifecycle performance using novel micro-contact metals, unique mechanical designs and packaging. Contact resistance can evolve over the lifetime of the micro-switch by increasing until failure. This work shows the fabrication of micro-contact support structures and test fixture which allow for micro-contact testing, with an emphasis on the fixture's design to allow the determination and analysis of the appropriate failure mode. The other effort of this investigation is the development of a micro-contact test fixture which can measure contact force and resistance directly and perform initial micro-contact characterization, and two forms of lifecycle testing for micro-contacts at rates up to 3kHz. In this work, two different designs of micro-contact structures are fabricated and tested, with each providing advantages for studying micro-contact physics. After fabrication was refined, three functioning fixed-fixed Au micro-contact support structures with contact radii of 4, 6, and 10 μm and two functioning fixed-fixed Ag micro-contacts were tested using the μN force sensor at cycle rates up to 3 kHz. Comparing the PolyMUMPs micro-contact support structure to the fixed-fixed micro-contact support structure, it was determined that the fixed-fixed micro-contact support structure is the best structure for studying the evolution of micro-contact resistance. The original document contains color images.
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fullrecord <record><control><sourceid>dtic_1RU</sourceid><recordid>TN_cdi_dtic_stinet_ADA582747</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ADA582747</sourcerecordid><originalsourceid>FETCH-dtic_stinet_ADA5827473</originalsourceid><addsrcrecordid>eNrjZAjwyy9LzVEISS0uUXDLrCgpLUpVSMsvUnDOSCxKTC5JLcqsysxLV_DNTC7KT87PKwGKFVspBKQWARXlJuYlpyok5qUoBKXmZCYmZeZkllTyMLCmJeYUp_JCaW4GGTfXEGcP3ZSSzOT44pLMvNSSeEcXR1MLI3MTc2MC0gB4-zSn</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>report</recordtype></control><display><type>report</type><title>Novel Test Fixture for Characterizing Microcontacts: Performance and Reliability</title><source>DTIC Technical Reports</source><creator>Toler, Benjamin F</creator><creatorcontrib>Toler, Benjamin F ; AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH GRADUATE SCHOOL OF ENGINEERING AND MANAGEMENT</creatorcontrib><description>Engineers have attempted to improve reliability and lifecycle performance using novel micro-contact metals, unique mechanical designs and packaging. Contact resistance can evolve over the lifetime of the micro-switch by increasing until failure. This work shows the fabrication of micro-contact support structures and test fixture which allow for micro-contact testing, with an emphasis on the fixture's design to allow the determination and analysis of the appropriate failure mode. The other effort of this investigation is the development of a micro-contact test fixture which can measure contact force and resistance directly and perform initial micro-contact characterization, and two forms of lifecycle testing for micro-contacts at rates up to 3kHz. In this work, two different designs of micro-contact structures are fabricated and tested, with each providing advantages for studying micro-contact physics. After fabrication was refined, three functioning fixed-fixed Au micro-contact support structures with contact radii of 4, 6, and 10 μm and two functioning fixed-fixed Ag micro-contacts were tested using the μN force sensor at cycle rates up to 3 kHz. Comparing the PolyMUMPs micro-contact support structure to the fixed-fixed micro-contact support structure, it was determined that the fixed-fixed micro-contact support structure is the best structure for studying the evolution of micro-contact resistance. The original document contains color images.</description><language>eng</language><subject>CONTACT EVOLUTION ; ENGINEERS ; EVOLUTION(GENERAL) ; LIFE CYCLES ; Mfg &amp; Industrial Eng &amp; Control of Product Sys ; MICRO-CONTACT PERFORMANCE AND RELIABILITY ; MICRO-CONTACT RESISTANCE ; MICRO-CONTACTS ; MICRO-SWITCHES ; PERFORMANCE(ENGINEERING) ; RELIABILITY ; Test Facilities, Equipment and Methods ; TEST FIXTURES</subject><creationdate>2013</creationdate><rights>Approved for public release; distribution is unlimited.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,780,885,27567,27568</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/ADA582747$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Toler, Benjamin F</creatorcontrib><creatorcontrib>AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH GRADUATE SCHOOL OF ENGINEERING AND MANAGEMENT</creatorcontrib><title>Novel Test Fixture for Characterizing Microcontacts: Performance and Reliability</title><description>Engineers have attempted to improve reliability and lifecycle performance using novel micro-contact metals, unique mechanical designs and packaging. Contact resistance can evolve over the lifetime of the micro-switch by increasing until failure. This work shows the fabrication of micro-contact support structures and test fixture which allow for micro-contact testing, with an emphasis on the fixture's design to allow the determination and analysis of the appropriate failure mode. The other effort of this investigation is the development of a micro-contact test fixture which can measure contact force and resistance directly and perform initial micro-contact characterization, and two forms of lifecycle testing for micro-contacts at rates up to 3kHz. In this work, two different designs of micro-contact structures are fabricated and tested, with each providing advantages for studying micro-contact physics. After fabrication was refined, three functioning fixed-fixed Au micro-contact support structures with contact radii of 4, 6, and 10 μm and two functioning fixed-fixed Ag micro-contacts were tested using the μN force sensor at cycle rates up to 3 kHz. Comparing the PolyMUMPs micro-contact support structure to the fixed-fixed micro-contact support structure, it was determined that the fixed-fixed micro-contact support structure is the best structure for studying the evolution of micro-contact resistance. The original document contains color images.</description><subject>CONTACT EVOLUTION</subject><subject>ENGINEERS</subject><subject>EVOLUTION(GENERAL)</subject><subject>LIFE CYCLES</subject><subject>Mfg &amp; Industrial Eng &amp; Control of Product Sys</subject><subject>MICRO-CONTACT PERFORMANCE AND RELIABILITY</subject><subject>MICRO-CONTACT RESISTANCE</subject><subject>MICRO-CONTACTS</subject><subject>MICRO-SWITCHES</subject><subject>PERFORMANCE(ENGINEERING)</subject><subject>RELIABILITY</subject><subject>Test Facilities, Equipment and Methods</subject><subject>TEST FIXTURES</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>2013</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZAjwyy9LzVEISS0uUXDLrCgpLUpVSMsvUnDOSCxKTC5JLcqsysxLV_DNTC7KT87PKwGKFVspBKQWARXlJuYlpyok5qUoBKXmZCYmZeZkllTyMLCmJeYUp_JCaW4GGTfXEGcP3ZSSzOT44pLMvNSSeEcXR1MLI3MTc2MC0gB4-zSn</recordid><startdate>201303</startdate><enddate>201303</enddate><creator>Toler, Benjamin F</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>201303</creationdate><title>Novel Test Fixture for Characterizing Microcontacts: Performance and Reliability</title><author>Toler, Benjamin F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_ADA5827473</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>2013</creationdate><topic>CONTACT EVOLUTION</topic><topic>ENGINEERS</topic><topic>EVOLUTION(GENERAL)</topic><topic>LIFE CYCLES</topic><topic>Mfg &amp; Industrial Eng &amp; Control of Product Sys</topic><topic>MICRO-CONTACT PERFORMANCE AND RELIABILITY</topic><topic>MICRO-CONTACT RESISTANCE</topic><topic>MICRO-CONTACTS</topic><topic>MICRO-SWITCHES</topic><topic>PERFORMANCE(ENGINEERING)</topic><topic>RELIABILITY</topic><topic>Test Facilities, Equipment and Methods</topic><topic>TEST FIXTURES</topic><toplevel>online_resources</toplevel><creatorcontrib>Toler, Benjamin F</creatorcontrib><creatorcontrib>AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH GRADUATE SCHOOL OF ENGINEERING AND MANAGEMENT</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Toler, Benjamin F</au><aucorp>AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH GRADUATE SCHOOL OF ENGINEERING AND MANAGEMENT</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>Novel Test Fixture for Characterizing Microcontacts: Performance and Reliability</btitle><date>2013-03</date><risdate>2013</risdate><abstract>Engineers have attempted to improve reliability and lifecycle performance using novel micro-contact metals, unique mechanical designs and packaging. Contact resistance can evolve over the lifetime of the micro-switch by increasing until failure. This work shows the fabrication of micro-contact support structures and test fixture which allow for micro-contact testing, with an emphasis on the fixture's design to allow the determination and analysis of the appropriate failure mode. The other effort of this investigation is the development of a micro-contact test fixture which can measure contact force and resistance directly and perform initial micro-contact characterization, and two forms of lifecycle testing for micro-contacts at rates up to 3kHz. In this work, two different designs of micro-contact structures are fabricated and tested, with each providing advantages for studying micro-contact physics. After fabrication was refined, three functioning fixed-fixed Au micro-contact support structures with contact radii of 4, 6, and 10 μm and two functioning fixed-fixed Ag micro-contacts were tested using the μN force sensor at cycle rates up to 3 kHz. Comparing the PolyMUMPs micro-contact support structure to the fixed-fixed micro-contact support structure, it was determined that the fixed-fixed micro-contact support structure is the best structure for studying the evolution of micro-contact resistance. The original document contains color images.</abstract><oa>free_for_read</oa></addata></record>
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source DTIC Technical Reports
subjects CONTACT EVOLUTION
ENGINEERS
EVOLUTION(GENERAL)
LIFE CYCLES
Mfg & Industrial Eng & Control of Product Sys
MICRO-CONTACT PERFORMANCE AND RELIABILITY
MICRO-CONTACT RESISTANCE
MICRO-CONTACTS
MICRO-SWITCHES
PERFORMANCE(ENGINEERING)
RELIABILITY
Test Facilities, Equipment and Methods
TEST FIXTURES
title Novel Test Fixture for Characterizing Microcontacts: Performance and Reliability
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T02%3A27%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-dtic_1RU&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.btitle=Novel%20Test%20Fixture%20for%20Characterizing%20Microcontacts:%20Performance%20and%20Reliability&rft.au=Toler,%20Benjamin%20F&rft.aucorp=AIR%20FORCE%20INST%20OF%20TECH%20WRIGHT-PATTERSON%20AFB%20OH%20GRADUATE%20SCHOOL%20OF%20ENGINEERING%20AND%20MANAGEMENT&rft.date=2013-03&rft_id=info:doi/&rft_dat=%3Cdtic_1RU%3EADA582747%3C/dtic_1RU%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true