Measurements and Calculations of Loss Due to Finite Conductivity and Surface Roughness in Microstrip Lines

Finite conductivity and surface roughness, two often significant causes of loss in microstrip lines, are examined in this dissertation. First, actual data are gathered. Gold lines are fabricated on semi-insulating gallium arsenide substrates. Losses are measured for the three canonical types of surf...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Nichols, Todd W
Format:	Report
Sprache:	eng
Schlagworte:	COMPUTATIONS COMPUTER PROGRAMS CONDUCTIVITY GALLIUM ARSENIDES INSULATION LENGTH LOSSES MICROWAVE TRANSMISSION Radiofrequency Wave Propagation STRIP TRANSMISSION LINES SUBSTRATES SURFACE ROUGHNESS
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