Temperature Measurements with Micrometer Spatial Resolution
A novel technique has been developed to measure temperatures with a spatial resolution less than 10 micron. This method uses the temperature- sensitive time decay fluorescence of a phosphor as a surface sensor. The spatial resolution is obtained by using an electron beam to excite individual phospho...
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| creator | Izaguirre, Francisco Csanky, Geza Hawkins, Gary F |
| description | A novel technique has been developed to measure temperatures with a spatial resolution less than 10 micron. This method uses the temperature- sensitive time decay fluorescence of a phosphor as a surface sensor. The spatial resolution is obtained by using an electron beam to excite individual phosphor grains deposited on the surface of interest. The phosphor selected for its dynamic range and chemical stability is the inorganic compound magnesium fluorogermanate activated with manganese. The time decay constant of its fluorescence decreases monotonically with temperature between -200 to 450 deg C. This method was verified on a cross-sectioned Zener diode. A description of the technique and a temperature map of the sectioned area of an operating diode are presented. |
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This method uses the temperature- sensitive time decay fluorescence of a phosphor as a surface sensor. The spatial resolution is obtained by using an electron beam to excite individual phosphor grains deposited on the surface of interest. The phosphor selected for its dynamic range and chemical stability is the inorganic compound magnesium fluorogermanate activated with manganese. The time decay constant of its fluorescence decreases monotonically with temperature between -200 to 450 deg C. This method was verified on a cross-sectioned Zener diode. A description of the technique and a temperature map of the sectioned area of an operating diode are presented.</description><language>eng</language><subject>AVALANCHE DIODES ; CHEMICALS ; CONSTANTS ; DECAY ; DIODES ; DYNAMIC RANGE ; DYNAMICS ; Electrical and Electronic Equipment ; ELECTRON BEAMS ; ELECTRONS ; FLUORESCENCE ; INORGANIC COMPOUNDS ; JUNCTIONS ; MAGNESIUM ; MANGANESE ; PHOSPHORS ; RESOLUTION ; SEMICONDUCTORS ; STABILITY ; SURFACES ; TEMPERATURE</subject><creationdate>1992</creationdate><rights>Approved for public release; distribution is unlimited.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,776,881,27546,27547</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/ADA255897$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Izaguirre, Francisco</creatorcontrib><creatorcontrib>Csanky, Geza</creatorcontrib><creatorcontrib>Hawkins, Gary F</creatorcontrib><creatorcontrib>AEROSPACE CORP EL SEGUNDO CA ENGINEERING AND TECHNOLOGY GROUP</creatorcontrib><title>Temperature Measurements with Micrometer Spatial Resolution</title><description>A novel technique has been developed to measure temperatures with a spatial resolution less than 10 micron. This method uses the temperature- sensitive time decay fluorescence of a phosphor as a surface sensor. The spatial resolution is obtained by using an electron beam to excite individual phosphor grains deposited on the surface of interest. The phosphor selected for its dynamic range and chemical stability is the inorganic compound magnesium fluorogermanate activated with manganese. The time decay constant of its fluorescence decreases monotonically with temperature between -200 to 450 deg C. This method was verified on a cross-sectioned Zener diode. A description of the technique and a temperature map of the sectioned area of an operating diode are presented.</description><subject>AVALANCHE DIODES</subject><subject>CHEMICALS</subject><subject>CONSTANTS</subject><subject>DECAY</subject><subject>DIODES</subject><subject>DYNAMIC RANGE</subject><subject>DYNAMICS</subject><subject>Electrical and Electronic Equipment</subject><subject>ELECTRON BEAMS</subject><subject>ELECTRONS</subject><subject>FLUORESCENCE</subject><subject>INORGANIC COMPOUNDS</subject><subject>JUNCTIONS</subject><subject>MAGNESIUM</subject><subject>MANGANESE</subject><subject>PHOSPHORS</subject><subject>RESOLUTION</subject><subject>SEMICONDUCTORS</subject><subject>STABILITY</subject><subject>SURFACES</subject><subject>TEMPERATURE</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1992</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZLAOSc0tSC1KLCktSlXwTU0sBtK5qXklxQrlmSUZCr6ZyUX5uaklqUUKwQWJJZmJOQpBqcX5OaUlmfl5PAysaYk5xam8UJqbQcbNNcTZQzelJDM5vrgkMy-1JN7RxdHI1NTC0tyYgDQAKUwtYg</recordid><startdate>19920724</startdate><enddate>19920724</enddate><creator>Izaguirre, Francisco</creator><creator>Csanky, Geza</creator><creator>Hawkins, Gary F</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>19920724</creationdate><title>Temperature Measurements with Micrometer Spatial Resolution</title><author>Izaguirre, Francisco ; Csanky, Geza ; Hawkins, Gary F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_ADA2558973</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1992</creationdate><topic>AVALANCHE DIODES</topic><topic>CHEMICALS</topic><topic>CONSTANTS</topic><topic>DECAY</topic><topic>DIODES</topic><topic>DYNAMIC RANGE</topic><topic>DYNAMICS</topic><topic>Electrical and Electronic Equipment</topic><topic>ELECTRON BEAMS</topic><topic>ELECTRONS</topic><topic>FLUORESCENCE</topic><topic>INORGANIC COMPOUNDS</topic><topic>JUNCTIONS</topic><topic>MAGNESIUM</topic><topic>MANGANESE</topic><topic>PHOSPHORS</topic><topic>RESOLUTION</topic><topic>SEMICONDUCTORS</topic><topic>STABILITY</topic><topic>SURFACES</topic><topic>TEMPERATURE</topic><toplevel>online_resources</toplevel><creatorcontrib>Izaguirre, Francisco</creatorcontrib><creatorcontrib>Csanky, Geza</creatorcontrib><creatorcontrib>Hawkins, Gary F</creatorcontrib><creatorcontrib>AEROSPACE CORP EL SEGUNDO CA ENGINEERING AND TECHNOLOGY GROUP</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Izaguirre, Francisco</au><au>Csanky, Geza</au><au>Hawkins, Gary F</au><aucorp>AEROSPACE CORP EL SEGUNDO CA ENGINEERING AND TECHNOLOGY GROUP</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>Temperature Measurements with Micrometer Spatial Resolution</btitle><date>1992-07-24</date><risdate>1992</risdate><abstract>A novel technique has been developed to measure temperatures with a spatial resolution less than 10 micron. This method uses the temperature- sensitive time decay fluorescence of a phosphor as a surface sensor. The spatial resolution is obtained by using an electron beam to excite individual phosphor grains deposited on the surface of interest. The phosphor selected for its dynamic range and chemical stability is the inorganic compound magnesium fluorogermanate activated with manganese. The time decay constant of its fluorescence decreases monotonically with temperature between -200 to 450 deg C. This method was verified on a cross-sectioned Zener diode. A description of the technique and a temperature map of the sectioned area of an operating diode are presented.</abstract><oa>free_for_read</oa></addata></record> |
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| source | DTIC Technical Reports |
| subjects | AVALANCHE DIODES CHEMICALS CONSTANTS DECAY DIODES DYNAMIC RANGE DYNAMICS Electrical and Electronic Equipment ELECTRON BEAMS ELECTRONS FLUORESCENCE INORGANIC COMPOUNDS JUNCTIONS MAGNESIUM MANGANESE PHOSPHORS RESOLUTION SEMICONDUCTORS STABILITY SURFACES TEMPERATURE |
| title | Temperature Measurements with Micrometer Spatial Resolution |
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