Use of Polished Fused Silica to Standardize Directional Polarized Emittance and Reflectance Measurements in the Infrared

The results of a round robin of measurements for the purpose of standardizing infrared directional emittance and reflectance apparatus in three laboratories are presented. Polarizers were incorporated in two of the devices, which have dispersing monochromators in their optical paths. Samples of bare...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Champetier,R. J, Friese,G. J
Format:	Report
Sprache:	eng
Schlagworte:	Emission Emissometers Errors Gold Infrared spectra Infrared spectrometers Optics Performance evaluation Performance(Engineering) Polarization Reflectance Reflectometers Sensitivity Silica glass Standardization Test Facilities, Equipment and Methods
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	Champetier,R. J Friese,G. J
description	The results of a round robin of measurements for the purpose of standardizing infrared directional emittance and reflectance apparatus in three laboratories are presented. Polarizers were incorporated in two of the devices, which have dispersing monochromators in their optical paths. Samples of bare polished fused silica as well as gold evaporated on polished nickel were the basis for the calibration. Their directional polarized properties were independently computed using published optical constants, and are presented here. (Modified author abstract)
format	Report
fullrecord	<record><control><sourceid>dtic_1RU</sourceid><recordid>TN_cdi_dtic_stinet_AD0786783</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AD0786783</sourcerecordid><originalsourceid>FETCH-dtic_stinet_AD07867833</originalsourceid><addsrcrecordid>eNqFi7EKwkAQRNNYiPoHFvsDgiCYtGIStBDEaB2Wuz2ycLmD2w2IX-8p9jYzzMybefF8CEF0cI2eZSAL7SRZO_ZsEDRCpxgsJssvgpoTGeUY0H8OmHJpoRlZM2QIMgk3cj5D33whlCnRSEEFOIAOBOfgEiayy2Lm0Autfr4o1m1zP542Vtn0ohxI-0O9Lat9We12f-Y3i4BCxg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>report</recordtype></control><display><type>report</type><title>Use of Polished Fused Silica to Standardize Directional Polarized Emittance and Reflectance Measurements in the Infrared</title><source>DTIC Technical Reports</source><creator>Champetier,R. J ; Friese,G. J</creator><creatorcontrib>Champetier,R. J ; Friese,G. J ; AEROSPACE CORP EL SEGUNDO CALIF LAB OPERATIONS</creatorcontrib><description>The results of a round robin of measurements for the purpose of standardizing infrared directional emittance and reflectance apparatus in three laboratories are presented. Polarizers were incorporated in two of the devices, which have dispersing monochromators in their optical paths. Samples of bare polished fused silica as well as gold evaporated on polished nickel were the basis for the calibration. Their directional polarized properties were independently computed using published optical constants, and are presented here. (Modified author abstract)</description><language>eng</language><subject>Emission ; Emissometers ; Errors ; Gold ; Infrared spectra ; Infrared spectrometers ; Optics ; Performance evaluation ; Performance(Engineering) ; Polarization ; Reflectance ; Reflectometers ; Sensitivity ; Silica glass ; Standardization ; Test Facilities, Equipment and Methods</subject><creationdate>1974</creationdate><rights>APPROVED FOR PUBLIC RELEASE</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,776,881,27546,27547</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/AD0786783$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Champetier,R. J</creatorcontrib><creatorcontrib>Friese,G. J</creatorcontrib><creatorcontrib>AEROSPACE CORP EL SEGUNDO CALIF LAB OPERATIONS</creatorcontrib><title>Use of Polished Fused Silica to Standardize Directional Polarized Emittance and Reflectance Measurements in the Infrared</title><description>The results of a round robin of measurements for the purpose of standardizing infrared directional emittance and reflectance apparatus in three laboratories are presented. Polarizers were incorporated in two of the devices, which have dispersing monochromators in their optical paths. Samples of bare polished fused silica as well as gold evaporated on polished nickel were the basis for the calibration. Their directional polarized properties were independently computed using published optical constants, and are presented here. (Modified author abstract)</description><subject>Emission</subject><subject>Emissometers</subject><subject>Errors</subject><subject>Gold</subject><subject>Infrared spectra</subject><subject>Infrared spectrometers</subject><subject>Optics</subject><subject>Performance evaluation</subject><subject>Performance(Engineering)</subject><subject>Polarization</subject><subject>Reflectance</subject><subject>Reflectometers</subject><subject>Sensitivity</subject><subject>Silica glass</subject><subject>Standardization</subject><subject>Test Facilities, Equipment and Methods</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1974</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNqFi7EKwkAQRNNYiPoHFvsDgiCYtGIStBDEaB2Wuz2ycLmD2w2IX-8p9jYzzMybefF8CEF0cI2eZSAL7SRZO_ZsEDRCpxgsJssvgpoTGeUY0H8OmHJpoRlZM2QIMgk3cj5D33whlCnRSEEFOIAOBOfgEiayy2Lm0Autfr4o1m1zP542Vtn0ohxI-0O9Lat9We12f-Y3i4BCxg</recordid><startdate>19740809</startdate><enddate>19740809</enddate><creator>Champetier,R. J</creator><creator>Friese,G. J</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>19740809</creationdate><title>Use of Polished Fused Silica to Standardize Directional Polarized Emittance and Reflectance Measurements in the Infrared</title><author>Champetier,R. J ; Friese,G. J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_AD07867833</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1974</creationdate><topic>Emission</topic><topic>Emissometers</topic><topic>Errors</topic><topic>Gold</topic><topic>Infrared spectra</topic><topic>Infrared spectrometers</topic><topic>Optics</topic><topic>Performance evaluation</topic><topic>Performance(Engineering)</topic><topic>Polarization</topic><topic>Reflectance</topic><topic>Reflectometers</topic><topic>Sensitivity</topic><topic>Silica glass</topic><topic>Standardization</topic><topic>Test Facilities, Equipment and Methods</topic><toplevel>online_resources</toplevel><creatorcontrib>Champetier,R. J</creatorcontrib><creatorcontrib>Friese,G. J</creatorcontrib><creatorcontrib>AEROSPACE CORP EL SEGUNDO CALIF LAB OPERATIONS</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Champetier,R. J</au><au>Friese,G. J</au><aucorp>AEROSPACE CORP EL SEGUNDO CALIF LAB OPERATIONS</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>Use of Polished Fused Silica to Standardize Directional Polarized Emittance and Reflectance Measurements in the Infrared</btitle><date>1974-08-09</date><risdate>1974</risdate><abstract>The results of a round robin of measurements for the purpose of standardizing infrared directional emittance and reflectance apparatus in three laboratories are presented. Polarizers were incorporated in two of the devices, which have dispersing monochromators in their optical paths. Samples of bare polished fused silica as well as gold evaporated on polished nickel were the basis for the calibration. Their directional polarized properties were independently computed using published optical constants, and are presented here. (Modified author abstract)</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_dtic_stinet_AD0786783
source	DTIC Technical Reports
subjects	Emission Emissometers Errors Gold Infrared spectra Infrared spectrometers Optics Performance evaluation Performance(Engineering) Polarization Reflectance Reflectometers Sensitivity Silica glass Standardization Test Facilities, Equipment and Methods
title	Use of Polished Fused Silica to Standardize Directional Polarized Emittance and Reflectance Measurements in the Infrared
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T22%3A42%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-dtic_1RU&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.btitle=Use%20of%20Polished%20Fused%20Silica%20to%20Standardize%20Directional%20Polarized%20Emittance%20and%20Reflectance%20Measurements%20in%20the%20Infrared&rft.au=Champetier,R.%20J&rft.aucorp=AEROSPACE%20CORP%20EL%20SEGUNDO%20CALIF%20LAB%20OPERATIONS&rft.date=1974-08-09&rft_id=info:doi/&rft_dat=%3Cdtic_1RU%3EAD0786783%3C/dtic_1RU%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true