Accelerated Reliability Tests by the Continuous Loading Method
Some of the theoretical aspects of the continuous loading method for accelerated reliability tests of circuit components are described. This method makes it possible to calculate the average trouble free service life of a component operating at rated work performance. (Author) Edited trans. of Akade...
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creator | Gugushvili,D. F Namicheishvili,O. M |
description | Some of the theoretical aspects of the continuous loading method for accelerated reliability tests of circuit components are described. This method makes it possible to calculate the average trouble free service life of a component operating at rated work performance. (Author)
Edited trans. of Akademiya Nauk Gruzinskoi SSR, Tiflis. Soobshcheniya, v61 p45-48 1971, by R. J. Zeccola. |
format | Report |
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Edited trans. of Akademiya Nauk Gruzinskoi SSR, Tiflis. Soobshcheniya, v61 p45-48 1971, by R. J. Zeccola.</description><subject>ACCELERATED TESTING</subject><subject>CIRCUITS</subject><subject>Electrical and Electronic Equipment</subject><subject>FAILURE(ELECTRONICS)</subject><subject>RELIABILITY(ELECTRONICS)</subject><subject>STATISTICAL ANALYSIS</subject><subject>TRANSLATIONS</subject><subject>USSR</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1972</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZLBzTE5OzUktSixJTVEISs3JTEzKzMksqVQISS0uKVZIqlQoyUhVcM7PK8nMK80vLVbwyU9MycxLV_BNLcnIT-FhYE1LzClO5YXS3Awybq4hzh66KSWZyfHFQE2pJfGOLgbmpkZmFpbGBKQBYDUtdQ</recordid><startdate>19721023</startdate><enddate>19721023</enddate><creator>Gugushvili,D. F</creator><creator>Namicheishvili,O. M</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>19721023</creationdate><title>Accelerated Reliability Tests by the Continuous Loading Method</title><author>Gugushvili,D. F ; Namicheishvili,O. M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_AD07526893</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1972</creationdate><topic>ACCELERATED TESTING</topic><topic>CIRCUITS</topic><topic>Electrical and Electronic Equipment</topic><topic>FAILURE(ELECTRONICS)</topic><topic>RELIABILITY(ELECTRONICS)</topic><topic>STATISTICAL ANALYSIS</topic><topic>TRANSLATIONS</topic><topic>USSR</topic><toplevel>online_resources</toplevel><creatorcontrib>Gugushvili,D. F</creatorcontrib><creatorcontrib>Namicheishvili,O. M</creatorcontrib><creatorcontrib>FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gugushvili,D. F</au><au>Namicheishvili,O. M</au><aucorp>FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>Accelerated Reliability Tests by the Continuous Loading Method</btitle><date>1972-10-23</date><risdate>1972</risdate><abstract>Some of the theoretical aspects of the continuous loading method for accelerated reliability tests of circuit components are described. This method makes it possible to calculate the average trouble free service life of a component operating at rated work performance. (Author)
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subjects | ACCELERATED TESTING CIRCUITS Electrical and Electronic Equipment FAILURE(ELECTRONICS) RELIABILITY(ELECTRONICS) STATISTICAL ANALYSIS TRANSLATIONS USSR |
title | Accelerated Reliability Tests by the Continuous Loading Method |
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