THE OPTICAL PROPERTIES OF THIN GERMANIUM FILMS
The central topic is the deduction of the optical constants from photometric measurements on epitaxial Ge films on CaF2 in the wavelength range 2000 - 6000A. Methods of film production are discussed, and the effect of deposition parameters on the crystallinity and reflectivity of films on fused quar...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Report |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Grant,Paul Michael |
| description | The central topic is the deduction of the optical constants from photometric measurements on epitaxial Ge films on CaF2 in the wavelength range 2000 - 6000A. Methods of film production are discussed, and the effect of deposition parameters on the crystallinity and reflectivity of films on fused quartz and CaF2 are reported. The principal conclusion is that epitaxial films give excellent agreement with bulk single crystal material as regards interband transition structure in their reflectivity and transmissivity coefficients R and T. However, the over-all amplitudes of R and T for films are strongly governed by residual surface roughness effects. Theoretical studies are carried out on the accuracy of derivation of the optical constants n and k from measurements of normal incidence R and T on a single film. A review is given of previous investigations and measurements of the optical properties and constants of germanium thin films. (Author) |
| format | Report |
| fullrecord | <record><control><sourceid>dtic_1RU</sourceid><recordid>TN_cdi_dtic_stinet_AD0619071</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AD0619071</sourcerecordid><originalsourceid>FETCH-dtic_stinet_AD06190713</originalsourceid><addsrcrecordid>eNrjZNAL8XBV8A8I8XR29FEICPIPcA0K8XQNVvB3Uwjx8PRTcHcN8nX08wz1VXDz9PEN5mFgTUvMKU7lhdLcDDJuriHOHropJZnJ8cUlmXmpJfGOLgZmhpYG5obGBKQBaosiwQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>report</recordtype></control><display><type>report</type><title>THE OPTICAL PROPERTIES OF THIN GERMANIUM FILMS</title><source>DTIC Technical Reports</source><creator>Grant,Paul Michael</creator><creatorcontrib>Grant,Paul Michael ; HARVARD UNIV CAMBRIDGE MASS DIV OF ENGINEERING AND APPLIED PHYSICS</creatorcontrib><description>The central topic is the deduction of the optical constants from photometric measurements on epitaxial Ge films on CaF2 in the wavelength range 2000 - 6000A. Methods of film production are discussed, and the effect of deposition parameters on the crystallinity and reflectivity of films on fused quartz and CaF2 are reported. The principal conclusion is that epitaxial films give excellent agreement with bulk single crystal material as regards interband transition structure in their reflectivity and transmissivity coefficients R and T. However, the over-all amplitudes of R and T for films are strongly governed by residual surface roughness effects. Theoretical studies are carried out on the accuracy of derivation of the optical constants n and k from measurements of normal incidence R and T on a single film. A review is given of previous investigations and measurements of the optical properties and constants of germanium thin films. (Author)</description><language>eng</language><subject>BAND SPECTRA ; CALCIUM COMPOUNDS ; COMPUTER PROGRAMMING ; CRYSTAL STRUCTURE ; ELECTRON DIFFRACTION ; EPITAXIAL GROWTH ; FLUORIDES ; OPTICAL PROPERTIES ; QUARTZ ; REFLECTION ; SEMICONDUCTING FILMS ; SPECTROPHOTOMETERS ; SURFACE PROPERTIES ; THICK FILMS ; THICKNESS ; VAPOR PLATING ; WAVE PROPAGATION</subject><creationdate>1965</creationdate><rights>APPROVED FOR PUBLIC RELEASE</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,777,882,27548,27549</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/AD0619071$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Grant,Paul Michael</creatorcontrib><creatorcontrib>HARVARD UNIV CAMBRIDGE MASS DIV OF ENGINEERING AND APPLIED PHYSICS</creatorcontrib><title>THE OPTICAL PROPERTIES OF THIN GERMANIUM FILMS</title><description>The central topic is the deduction of the optical constants from photometric measurements on epitaxial Ge films on CaF2 in the wavelength range 2000 - 6000A. Methods of film production are discussed, and the effect of deposition parameters on the crystallinity and reflectivity of films on fused quartz and CaF2 are reported. The principal conclusion is that epitaxial films give excellent agreement with bulk single crystal material as regards interband transition structure in their reflectivity and transmissivity coefficients R and T. However, the over-all amplitudes of R and T for films are strongly governed by residual surface roughness effects. Theoretical studies are carried out on the accuracy of derivation of the optical constants n and k from measurements of normal incidence R and T on a single film. A review is given of previous investigations and measurements of the optical properties and constants of germanium thin films. (Author)</description><subject>BAND SPECTRA</subject><subject>CALCIUM COMPOUNDS</subject><subject>COMPUTER PROGRAMMING</subject><subject>CRYSTAL STRUCTURE</subject><subject>ELECTRON DIFFRACTION</subject><subject>EPITAXIAL GROWTH</subject><subject>FLUORIDES</subject><subject>OPTICAL PROPERTIES</subject><subject>QUARTZ</subject><subject>REFLECTION</subject><subject>SEMICONDUCTING FILMS</subject><subject>SPECTROPHOTOMETERS</subject><subject>SURFACE PROPERTIES</subject><subject>THICK FILMS</subject><subject>THICKNESS</subject><subject>VAPOR PLATING</subject><subject>WAVE PROPAGATION</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1965</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZNAL8XBV8A8I8XR29FEICPIPcA0K8XQNVvB3Uwjx8PRTcHcN8nX08wz1VXDz9PEN5mFgTUvMKU7lhdLcDDJuriHOHropJZnJ8cUlmXmpJfGOLgZmhpYG5obGBKQBaosiwQ</recordid><startdate>196506</startdate><enddate>196506</enddate><creator>Grant,Paul Michael</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>196506</creationdate><title>THE OPTICAL PROPERTIES OF THIN GERMANIUM FILMS</title><author>Grant,Paul Michael</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_AD06190713</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1965</creationdate><topic>BAND SPECTRA</topic><topic>CALCIUM COMPOUNDS</topic><topic>COMPUTER PROGRAMMING</topic><topic>CRYSTAL STRUCTURE</topic><topic>ELECTRON DIFFRACTION</topic><topic>EPITAXIAL GROWTH</topic><topic>FLUORIDES</topic><topic>OPTICAL PROPERTIES</topic><topic>QUARTZ</topic><topic>REFLECTION</topic><topic>SEMICONDUCTING FILMS</topic><topic>SPECTROPHOTOMETERS</topic><topic>SURFACE PROPERTIES</topic><topic>THICK FILMS</topic><topic>THICKNESS</topic><topic>VAPOR PLATING</topic><topic>WAVE PROPAGATION</topic><toplevel>online_resources</toplevel><creatorcontrib>Grant,Paul Michael</creatorcontrib><creatorcontrib>HARVARD UNIV CAMBRIDGE MASS DIV OF ENGINEERING AND APPLIED PHYSICS</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Grant,Paul Michael</au><aucorp>HARVARD UNIV CAMBRIDGE MASS DIV OF ENGINEERING AND APPLIED PHYSICS</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>THE OPTICAL PROPERTIES OF THIN GERMANIUM FILMS</btitle><date>1965-06</date><risdate>1965</risdate><abstract>The central topic is the deduction of the optical constants from photometric measurements on epitaxial Ge films on CaF2 in the wavelength range 2000 - 6000A. Methods of film production are discussed, and the effect of deposition parameters on the crystallinity and reflectivity of films on fused quartz and CaF2 are reported. The principal conclusion is that epitaxial films give excellent agreement with bulk single crystal material as regards interband transition structure in their reflectivity and transmissivity coefficients R and T. However, the over-all amplitudes of R and T for films are strongly governed by residual surface roughness effects. Theoretical studies are carried out on the accuracy of derivation of the optical constants n and k from measurements of normal incidence R and T on a single film. A review is given of previous investigations and measurements of the optical properties and constants of germanium thin films. (Author)</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_dtic_stinet_AD0619071 |
| source | DTIC Technical Reports |
| subjects | BAND SPECTRA CALCIUM COMPOUNDS COMPUTER PROGRAMMING CRYSTAL STRUCTURE ELECTRON DIFFRACTION EPITAXIAL GROWTH FLUORIDES OPTICAL PROPERTIES QUARTZ REFLECTION SEMICONDUCTING FILMS SPECTROPHOTOMETERS SURFACE PROPERTIES THICK FILMS THICKNESS VAPOR PLATING WAVE PROPAGATION |
| title | THE OPTICAL PROPERTIES OF THIN GERMANIUM FILMS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T12%3A39%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-dtic_1RU&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.btitle=THE%20OPTICAL%20PROPERTIES%20OF%20THIN%20GERMANIUM%20FILMS&rft.au=Grant,Paul%20Michael&rft.aucorp=HARVARD%20UNIV%20CAMBRIDGE%20MASS%20DIV%20OF%20ENGINEERING%20AND%20APPLIED%20PHYSICS&rft.date=1965-06&rft_id=info:doi/&rft_dat=%3Cdtic_1RU%3EAD0619071%3C/dtic_1RU%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |