PRODUCTION ENGINEERING MEASURE FOR COLUMBIUM CAPACITORS
During this quarter, construction of the four ratings required for the preproduction sample was continued. Manufacture of three of these ratings was completed, and they are ready for testing. Preliminary findings in the study to determine the effects of voltage and capacitance derating indicate that...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Report |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Folster,J H D Holley,E E Whitman,A |
description | During this quarter, construction of the four ratings required for the preproduction sample was continued. Manufacture of three of these ratings was completed, and they are ready for testing. Preliminary findings in the study to determine the effects of voltage and capacitance derating indicate that voltage derating can be used to achieve better leakage current levels and improved stability of this important parameteeter. However, it iss cautioned that the leakage current behavior will still be inferior to that demonstrated by solid tantalum capacitors. (Author) |
format | Report |
fullrecord | <record><control><sourceid>dtic_1RU</sourceid><recordid>TN_cdi_dtic_stinet_AD0606677</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AD0606677</sourcerecordid><originalsourceid>FETCH-dtic_stinet_AD06066773</originalsourceid><addsrcrecordid>eNrjZDAPCPJ3CXUO8fT3U3D1c_f0c3UN8vRzV_B1dQwODXJVcPMPUnD29wn1dfIM9VVwdgxwdPYM8Q8K5mFgTUvMKU7lhdLcDDJuriHOHropJZnJ8cUlmXmpJfGOLgZmBmZm5ubGBKQB0CAlmQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>report</recordtype></control><display><type>report</type><title>PRODUCTION ENGINEERING MEASURE FOR COLUMBIUM CAPACITORS</title><source>DTIC Technical Reports</source><creator>Folster,J H D ; Holley,E E ; Whitman,A</creator><creatorcontrib>Folster,J H D ; Holley,E E ; Whitman,A ; SPRAGUE ELECTRIC CO NORTH ADAMS MASS</creatorcontrib><description>During this quarter, construction of the four ratings required for the preproduction sample was continued. Manufacture of three of these ratings was completed, and they are ready for testing. Preliminary findings in the study to determine the effects of voltage and capacitance derating indicate that voltage derating can be used to achieve better leakage current levels and improved stability of this important parameteeter. However, it iss cautioned that the leakage current behavior will still be inferior to that demonstrated by solid tantalum capacitors. (Author)</description><language>eng</language><subject>CAPACITANCE ; CAPACITORS ; LIFE EXPECTANCY(SERVICE LIFE) ; MANUFACTURING ; NIOBIUM ; PERFORMANCE(ENGINEERING) ; RELIABILITY(ELECTRONICS) ; STABILITY ; VOLTAGE</subject><creationdate>1964</creationdate><rights>APPROVED FOR PUBLIC RELEASE</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,778,883,27550,27551</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/AD0606677$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Folster,J H D</creatorcontrib><creatorcontrib>Holley,E E</creatorcontrib><creatorcontrib>Whitman,A</creatorcontrib><creatorcontrib>SPRAGUE ELECTRIC CO NORTH ADAMS MASS</creatorcontrib><title>PRODUCTION ENGINEERING MEASURE FOR COLUMBIUM CAPACITORS</title><description>During this quarter, construction of the four ratings required for the preproduction sample was continued. Manufacture of three of these ratings was completed, and they are ready for testing. Preliminary findings in the study to determine the effects of voltage and capacitance derating indicate that voltage derating can be used to achieve better leakage current levels and improved stability of this important parameteeter. However, it iss cautioned that the leakage current behavior will still be inferior to that demonstrated by solid tantalum capacitors. (Author)</description><subject>CAPACITANCE</subject><subject>CAPACITORS</subject><subject>LIFE EXPECTANCY(SERVICE LIFE)</subject><subject>MANUFACTURING</subject><subject>NIOBIUM</subject><subject>PERFORMANCE(ENGINEERING)</subject><subject>RELIABILITY(ELECTRONICS)</subject><subject>STABILITY</subject><subject>VOLTAGE</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1964</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZDAPCPJ3CXUO8fT3U3D1c_f0c3UN8vRzV_B1dQwODXJVcPMPUnD29wn1dfIM9VVwdgxwdPYM8Q8K5mFgTUvMKU7lhdLcDDJuriHOHropJZnJ8cUlmXmpJfGOLgZmBmZm5ubGBKQB0CAlmQ</recordid><startdate>19640626</startdate><enddate>19640626</enddate><creator>Folster,J H D</creator><creator>Holley,E E</creator><creator>Whitman,A</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>19640626</creationdate><title>PRODUCTION ENGINEERING MEASURE FOR COLUMBIUM CAPACITORS</title><author>Folster,J H D ; Holley,E E ; Whitman,A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_AD06066773</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1964</creationdate><topic>CAPACITANCE</topic><topic>CAPACITORS</topic><topic>LIFE EXPECTANCY(SERVICE LIFE)</topic><topic>MANUFACTURING</topic><topic>NIOBIUM</topic><topic>PERFORMANCE(ENGINEERING)</topic><topic>RELIABILITY(ELECTRONICS)</topic><topic>STABILITY</topic><topic>VOLTAGE</topic><toplevel>online_resources</toplevel><creatorcontrib>Folster,J H D</creatorcontrib><creatorcontrib>Holley,E E</creatorcontrib><creatorcontrib>Whitman,A</creatorcontrib><creatorcontrib>SPRAGUE ELECTRIC CO NORTH ADAMS MASS</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Folster,J H D</au><au>Holley,E E</au><au>Whitman,A</au><aucorp>SPRAGUE ELECTRIC CO NORTH ADAMS MASS</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>PRODUCTION ENGINEERING MEASURE FOR COLUMBIUM CAPACITORS</btitle><date>1964-06-26</date><risdate>1964</risdate><abstract>During this quarter, construction of the four ratings required for the preproduction sample was continued. Manufacture of three of these ratings was completed, and they are ready for testing. Preliminary findings in the study to determine the effects of voltage and capacitance derating indicate that voltage derating can be used to achieve better leakage current levels and improved stability of this important parameteeter. However, it iss cautioned that the leakage current behavior will still be inferior to that demonstrated by solid tantalum capacitors. (Author)</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_dtic_stinet_AD0606677 |
source | DTIC Technical Reports |
subjects | CAPACITANCE CAPACITORS LIFE EXPECTANCY(SERVICE LIFE) MANUFACTURING NIOBIUM PERFORMANCE(ENGINEERING) RELIABILITY(ELECTRONICS) STABILITY VOLTAGE |
title | PRODUCTION ENGINEERING MEASURE FOR COLUMBIUM CAPACITORS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T15%3A20%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-dtic_1RU&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.btitle=PRODUCTION%20ENGINEERING%20MEASURE%20FOR%20COLUMBIUM%20CAPACITORS&rft.au=Folster,J%20H%20D&rft.aucorp=SPRAGUE%20ELECTRIC%20CO%20NORTH%20ADAMS%20MASS&rft.date=1964-06-26&rft_id=info:doi/&rft_dat=%3Cdtic_1RU%3EAD0606677%3C/dtic_1RU%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |