Dielectric breakdown of 2D muscovite mica

Dielectric breakdown of 2D muscovite mica

Localized electrical breakdown (BD) measurements are performed on 2D muscovite mica flakes of ~ 2 to 15 nm thickness using Conduction Atomic Force Microscopy (CAFM). To obtain robust BD data by CAFM, the probed locations are spaced sufficiently far apart (> 1 µm) to avoid mutual interference and...

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Veröffentlicht in:Scientific reports 2022-08, Vol.12 (1), p.14076-11, Article 14076
Hauptverfasser: Maruvada, Anirudh, Shubhakar, Kalya, Raghavan, Nagarajan, Pey, Kin Leong, O’Shea, Sean J.
Format: Artikel
Sprache:eng
Schlagworte:
639/166/987
639/301/1005/1008
639/925/357/1018
639/925/357/995
639/925/927/1007
Atomic force microscopy
Boron
Crystal structure
Graphene
Heat conductivity
Humanities and Social Sciences
Microscopy
multidisciplinary
Potassium
Science
Science (multidisciplinary)
Silicon
Thermal conductivity
Transistors
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Zusammenfassung:Localized electrical breakdown (BD) measurements are performed on 2D muscovite mica flakes of ~ 2 to 15 nm thickness using Conduction Atomic Force Microscopy (CAFM). To obtain robust BD data by CAFM, the probed locations are spaced sufficiently far apart (> 1 µm) to avoid mutual interference and the maximum current is set to a low value (
ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-022-18320-7