MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities

The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM available from Infineon (formerly Cypress). Note that the internal...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Coronetti, Andrea, Luza, Lucas Matana, Bosser, Alexandre, Alía, Rubén García, Dilillo, Luigi, , Frédéric
Format:	Dataset
Sprache:	eng
Schlagworte:	Heavy ions Multiple cell upsets Protons Radiation effects Single event upsets SRAM
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	Coronetti, Andrea Luza, Lucas Matana Bosser, Alexandre Alía, Rubén García Dilillo, Luigi , Frédéric
description	The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM available from Infineon (formerly Cypress). Note that the internal ECC has been disabled for this data collection. More information on data collection are available through this paper (10.1109/REDW51883.2020.9325822). The MCU were determined through the procedure explained in these two papers (10.1109/TNS.2014.2313742 and 10.1109/TNS.2015.2496874).
doi_str_mv	10.5281/zenodo.8314388
format	Dataset
fullrecord	<record><control><sourceid>datacite_PQ8</sourceid><recordid>TN_cdi_datacite_primary_10_5281_zenodo_8314388</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_5281_zenodo_8314388</sourcerecordid><originalsourceid>FETCH-LOGICAL-d798-391c22a755dff400b48992c31be8472f546f35c2b018ba620260469923ecd24a3</originalsourceid><addsrcrecordid>eNotz0tLw0AUBeDZuJDq1vX9A4nzTCbLEnxBi6B15SLczEMHkkyYjEL89ba0q3vgHg58hNwxWiqu2f2fm6KNpRZMCq2vyee-_QCLGSFMgNCuc3LLApWCaYT3t-0efIojfDv8XSHEaQGcLMwp5lM2cRicyc4CZvhK8ef482jCEHJwyw258jgs7vZyN-Tw-HBon4vd69NLu90Vtm50IRpmOMdaKeu9pLSXumm4Eax3WtbcK1l5oQzvKdM9VpzyisrqWBHOWC5RbEh5nj0xTMium1MYMa0do90J3Z3R3QUt_gGkB0_0</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>dataset</recordtype></control><display><type>dataset</type><title>MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities</title><source>DataCite</source><creator>Coronetti, Andrea ; Luza, Lucas Matana ; Bosser, Alexandre ; Alía, Rubén García ; Dilillo, Luigi ; , Frédéric</creator><creatorcontrib>Coronetti, Andrea ; Luza, Lucas Matana ; Bosser, Alexandre ; Alía, Rubén García ; Dilillo, Luigi ; , Frédéric</creatorcontrib><description>The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM available from Infineon (formerly Cypress). Note that the internal ECC has been disabled for this data collection. More information on data collection are available through this paper (10.1109/REDW51883.2020.9325822). The MCU were determined through the procedure explained in these two papers (10.1109/TNS.2014.2313742 and 10.1109/TNS.2015.2496874).</description><identifier>DOI: 10.5281/zenodo.8314388</identifier><language>eng</language><publisher>Zenodo</publisher><subject>Heavy ions ; Multiple cell upsets ; Protons ; Radiation effects ; Single event upsets ; SRAM</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0001-8840-7400 ; 0000-0003-4633-9483 ; 0000-0002-1295-2688 ; 0000-0002-0764-9051 ; 0000-0001-8030-1804</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>776,1887</link.rule.ids><linktorsrc>$$Uhttps://commons.datacite.org/doi.org/10.5281/zenodo.8314388$$EView_record_in_DataCite.org$$FView_record_in_$$GDataCite.org$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Coronetti, Andrea</creatorcontrib><creatorcontrib>Luza, Lucas Matana</creatorcontrib><creatorcontrib>Bosser, Alexandre</creatorcontrib><creatorcontrib>Alía, Rubén García</creatorcontrib><creatorcontrib>Dilillo, Luigi</creatorcontrib><creatorcontrib>, Frédéric</creatorcontrib><title>MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities</title><description>The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM available from Infineon (formerly Cypress). Note that the internal ECC has been disabled for this data collection. More information on data collection are available through this paper (10.1109/REDW51883.2020.9325822). The MCU were determined through the procedure explained in these two papers (10.1109/TNS.2014.2313742 and 10.1109/TNS.2015.2496874).</description><subject>Heavy ions</subject><subject>Multiple cell upsets</subject><subject>Protons</subject><subject>Radiation effects</subject><subject>Single event upsets</subject><subject>SRAM</subject><fulltext>true</fulltext><rsrctype>dataset</rsrctype><creationdate>2023</creationdate><recordtype>dataset</recordtype><sourceid>PQ8</sourceid><recordid>eNotz0tLw0AUBeDZuJDq1vX9A4nzTCbLEnxBi6B15SLczEMHkkyYjEL89ba0q3vgHg58hNwxWiqu2f2fm6KNpRZMCq2vyee-_QCLGSFMgNCuc3LLApWCaYT3t-0efIojfDv8XSHEaQGcLMwp5lM2cRicyc4CZvhK8ef482jCEHJwyw258jgs7vZyN-Tw-HBon4vd69NLu90Vtm50IRpmOMdaKeu9pLSXumm4Eax3WtbcK1l5oQzvKdM9VpzyisrqWBHOWC5RbEh5nj0xTMium1MYMa0do90J3Z3R3QUt_gGkB0_0</recordid><startdate>20230904</startdate><enddate>20230904</enddate><creator>Coronetti, Andrea</creator><creator>Luza, Lucas Matana</creator><creator>Bosser, Alexandre</creator><creator>Alía, Rubén García</creator><creator>Dilillo, Luigi</creator><creator>, Frédéric</creator><general>Zenodo</general><scope>DYCCY</scope><scope>PQ8</scope><orcidid>https://orcid.org/0000-0001-8840-7400</orcidid><orcidid>https://orcid.org/0000-0003-4633-9483</orcidid><orcidid>https://orcid.org/0000-0002-1295-2688</orcidid><orcidid>https://orcid.org/0000-0002-0764-9051</orcidid><orcidid>https://orcid.org/0000-0001-8030-1804</orcidid></search><sort><creationdate>20230904</creationdate><title>MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities</title><author>Coronetti, Andrea ; Luza, Lucas Matana ; Bosser, Alexandre ; Alía, Rubén García ; Dilillo, Luigi ; , Frédéric</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-d798-391c22a755dff400b48992c31be8472f546f35c2b018ba620260469923ecd24a3</frbrgroupid><rsrctype>datasets</rsrctype><prefilter>datasets</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Heavy ions</topic><topic>Multiple cell upsets</topic><topic>Protons</topic><topic>Radiation effects</topic><topic>Single event upsets</topic><topic>SRAM</topic><toplevel>online_resources</toplevel><creatorcontrib>Coronetti, Andrea</creatorcontrib><creatorcontrib>Luza, Lucas Matana</creatorcontrib><creatorcontrib>Bosser, Alexandre</creatorcontrib><creatorcontrib>Alía, Rubén García</creatorcontrib><creatorcontrib>Dilillo, Luigi</creatorcontrib><creatorcontrib>, Frédéric</creatorcontrib><collection>DataCite (Open Access)</collection><collection>DataCite</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Coronetti, Andrea</au><au>Luza, Lucas Matana</au><au>Bosser, Alexandre</au><au>Alía, Rubén García</au><au>Dilillo, Luigi</au><au>, Frédéric</au><format>book</format><genre>unknown</genre><ristype>DATA</ristype><title>MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities</title><date>2023-09-04</date><risdate>2023</risdate><abstract>The dataset contains the raw MCU data collected at ground facilities under heavy ion and proton irradiation in the scope or RADSAGA and RADNEXT project. The device under consideration is the CY62167GE30-45ZXI, a 65 nm commercial SRAM available from Infineon (formerly Cypress). Note that the internal ECC has been disabled for this data collection. More information on data collection are available through this paper (10.1109/REDW51883.2020.9325822). The MCU were determined through the procedure explained in these two papers (10.1109/TNS.2014.2313742 and 10.1109/TNS.2015.2496874).</abstract><pub>Zenodo</pub><doi>10.5281/zenodo.8314388</doi><orcidid>https://orcid.org/0000-0001-8840-7400</orcidid><orcidid>https://orcid.org/0000-0003-4633-9483</orcidid><orcidid>https://orcid.org/0000-0002-1295-2688</orcidid><orcidid>https://orcid.org/0000-0002-0764-9051</orcidid><orcidid>https://orcid.org/0000-0001-8030-1804</orcidid><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier	DOI: 10.5281/zenodo.8314388
ispartof
issn
language	eng
recordid	cdi_datacite_primary_10_5281_zenodo_8314388
source	DataCite
subjects	Heavy ions Multiple cell upsets Protons Radiation effects Single event upsets SRAM
title	MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T14%3A14%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-datacite_PQ8&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.au=Coronetti,%20Andrea&rft.date=2023-09-04&rft_id=info:doi/10.5281/zenodo.8314388&rft_dat=%3Cdatacite_PQ8%3E10_5281_zenodo_8314388%3C/datacite_PQ8%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true