IODP Expedition 354 Scanning electron microscope images

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and captured as image files. These files were uploaded along with a brief description and a record of the microscopic conditions when the image was taken.

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Bibliographische Detailangaben
Hauptverfasser: France-Lanord, Christian, Spiess, Volkhard, Klaus, Adam, Schwenk, Tillmann, Adhikari, Rishi R., Adhikari, Swostik K., Bahk, Jang J., Baxter, Alan T., Cruz, Jarrett W., Das, Supriyo K., Dekens, Petra, Duleba, Wania, Fox, Lyndsey, Galy, Albert, Galy, Valier, Ge, Junyi, Gleason, James D., Gyawali, Babu, Huyghe, Pascale, Jia, Guodong, Lantzsch, Hendrik, Manoj, M. C., Martos, Yasmina M., Meynadier, Laure, Najman, Yani M.R., Nakajima, Arata, Ponton, Camilo, Reilly, Brendan T., Rogers, Kimberly G., Savian, Jairo F., Selkin, Peter A., Weber, Michael E., Williams, Trevor, Yoshida, Kohki
Format: Dataset
Sprache:eng
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Beschreibung
Zusammenfassung:Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and captured as image files. These files were uploaded along with a brief description and a record of the microscopic conditions when the image was taken.
DOI:10.5281/zenodo.7869303