Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"

Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*....

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Hauptverfasser: Mayr, Sina, Finizio, Simone, Reuteler, Joakim, Stutz, Stefan, Dubs, Carsten, Weigand, Markus, Hrabec, Aleš, Raabe, Jörg, Wintz, Sebastian
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creator Mayr, Sina
Finizio, Simone
Reuteler, Joakim
Stutz, Stefan
Dubs, Carsten
Weigand, Markus
Hrabec, Aleš
Raabe, Jörg
Wintz, Sebastian
description Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany
doi_str_mv 10.5281/zenodo.4753180
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fullrecord <record><control><sourceid>datacite_PQ8</sourceid><recordid>TN_cdi_datacite_primary_10_5281_zenodo_4753180</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_5281_zenodo_4753180</sourcerecordid><originalsourceid>FETCH-LOGICAL-d790-68024a7ecba8f0da8650d75a88e7bc0f5c22ea2cbf5370df9ef479692375c8333</originalsourceid><addsrcrecordid>eNotjztPwzAUhb0woMLKbHVPcOw4dkYoFCoVFdEM3cKNfY0iJU4Um6H8etLHdHQeOtJHyEPGUsl19viHfrBDmispMs1uyfcLRAgYqRsmujzMraefHYQe6HowvwEt3czRM0JPP9qua_3PebprIrT-5PaDi_SQfMGRVhP4MMKEPtI99GOHYXlHbhx0Ae-vuiDV-rVavSfb3dtm9bRNrCpZUmjGc1BoGtCOWdCFZFZJ0BpVY5iThnMEbhonhWLWlehyVRYlF0oaLYRYkPRya2ce00asx6ntYTrWGatP5PWFvL6Si39LU1Mi</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>dataset</recordtype></control><display><type>dataset</type><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><source>DataCite</source><creator>Mayr, Sina ; Finizio, Simone ; Reuteler, Joakim ; Stutz, Stefan ; Dubs, Carsten ; Weigand, Markus ; Hrabec, Aleš ; Raabe, Jörg ; Wintz, Sebastian</creator><creatorcontrib>Mayr, Sina ; Finizio, Simone ; Reuteler, Joakim ; Stutz, Stefan ; Dubs, Carsten ; Weigand, Markus ; Hrabec, Aleš ; Raabe, Jörg ; Wintz, Sebastian</creatorcontrib><description>Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany</description><identifier>DOI: 10.5281/zenodo.4753180</identifier><language>eng</language><publisher>Zenodo</publisher><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>776,1887</link.rule.ids><linktorsrc>$$Uhttps://commons.datacite.org/doi.org/10.5281/zenodo.4753180$$EView_record_in_DataCite.org$$FView_record_in_$$GDataCite.org$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Mayr, Sina</creatorcontrib><creatorcontrib>Finizio, Simone</creatorcontrib><creatorcontrib>Reuteler, Joakim</creatorcontrib><creatorcontrib>Stutz, Stefan</creatorcontrib><creatorcontrib>Dubs, Carsten</creatorcontrib><creatorcontrib>Weigand, Markus</creatorcontrib><creatorcontrib>Hrabec, Aleš</creatorcontrib><creatorcontrib>Raabe, Jörg</creatorcontrib><creatorcontrib>Wintz, Sebastian</creatorcontrib><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><description>Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany</description><fulltext>true</fulltext><rsrctype>dataset</rsrctype><creationdate>2021</creationdate><recordtype>dataset</recordtype><sourceid>PQ8</sourceid><recordid>eNotjztPwzAUhb0woMLKbHVPcOw4dkYoFCoVFdEM3cKNfY0iJU4Um6H8etLHdHQeOtJHyEPGUsl19viHfrBDmispMs1uyfcLRAgYqRsmujzMraefHYQe6HowvwEt3czRM0JPP9qua_3PebprIrT-5PaDi_SQfMGRVhP4MMKEPtI99GOHYXlHbhx0Ae-vuiDV-rVavSfb3dtm9bRNrCpZUmjGc1BoGtCOWdCFZFZJ0BpVY5iThnMEbhonhWLWlehyVRYlF0oaLYRYkPRya2ce00asx6ntYTrWGatP5PWFvL6Si39LU1Mi</recordid><startdate>20210513</startdate><enddate>20210513</enddate><creator>Mayr, Sina</creator><creator>Finizio, Simone</creator><creator>Reuteler, Joakim</creator><creator>Stutz, Stefan</creator><creator>Dubs, Carsten</creator><creator>Weigand, Markus</creator><creator>Hrabec, Aleš</creator><creator>Raabe, Jörg</creator><creator>Wintz, Sebastian</creator><general>Zenodo</general><scope>DYCCY</scope><scope>PQ8</scope></search><sort><creationdate>20210513</creationdate><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><author>Mayr, Sina ; Finizio, Simone ; Reuteler, Joakim ; Stutz, Stefan ; Dubs, Carsten ; Weigand, Markus ; Hrabec, Aleš ; Raabe, Jörg ; Wintz, Sebastian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-d790-68024a7ecba8f0da8650d75a88e7bc0f5c22ea2cbf5370df9ef479692375c8333</frbrgroupid><rsrctype>datasets</rsrctype><prefilter>datasets</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Mayr, Sina</creatorcontrib><creatorcontrib>Finizio, Simone</creatorcontrib><creatorcontrib>Reuteler, Joakim</creatorcontrib><creatorcontrib>Stutz, Stefan</creatorcontrib><creatorcontrib>Dubs, Carsten</creatorcontrib><creatorcontrib>Weigand, Markus</creatorcontrib><creatorcontrib>Hrabec, Aleš</creatorcontrib><creatorcontrib>Raabe, Jörg</creatorcontrib><creatorcontrib>Wintz, Sebastian</creatorcontrib><collection>DataCite (Open Access)</collection><collection>DataCite</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mayr, Sina</au><au>Finizio, Simone</au><au>Reuteler, Joakim</au><au>Stutz, Stefan</au><au>Dubs, Carsten</au><au>Weigand, Markus</au><au>Hrabec, Aleš</au><au>Raabe, Jörg</au><au>Wintz, Sebastian</au><format>book</format><genre>unknown</genre><ristype>DATA</ristype><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><date>2021-05-13</date><risdate>2021</risdate><abstract>Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany</abstract><pub>Zenodo</pub><doi>10.5281/zenodo.4753180</doi><oa>free_for_read</oa></addata></record>
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identifier DOI: 10.5281/zenodo.4753180
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title Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T01%3A12%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-datacite_PQ8&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.au=Mayr,%20Sina&rft.date=2021-05-13&rft_id=info:doi/10.5281/zenodo.4753180&rft_dat=%3Cdatacite_PQ8%3E10_5281_zenodo_4753180%3C/datacite_PQ8%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true