Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"
Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*....
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creator | Mayr, Sina Finizio, Simone Reuteler, Joakim Stutz, Stefan Dubs, Carsten Weigand, Markus Hrabec, Aleš Raabe, Jörg Wintz, Sebastian |
description | Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany |
doi_str_mv | 10.5281/zenodo.4753180 |
format | Dataset |
fullrecord | <record><control><sourceid>datacite_PQ8</sourceid><recordid>TN_cdi_datacite_primary_10_5281_zenodo_4753180</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_5281_zenodo_4753180</sourcerecordid><originalsourceid>FETCH-LOGICAL-d790-68024a7ecba8f0da8650d75a88e7bc0f5c22ea2cbf5370df9ef479692375c8333</originalsourceid><addsrcrecordid>eNotjztPwzAUhb0woMLKbHVPcOw4dkYoFCoVFdEM3cKNfY0iJU4Um6H8etLHdHQeOtJHyEPGUsl19viHfrBDmispMs1uyfcLRAgYqRsmujzMraefHYQe6HowvwEt3czRM0JPP9qua_3PebprIrT-5PaDi_SQfMGRVhP4MMKEPtI99GOHYXlHbhx0Ae-vuiDV-rVavSfb3dtm9bRNrCpZUmjGc1BoGtCOWdCFZFZJ0BpVY5iThnMEbhonhWLWlehyVRYlF0oaLYRYkPRya2ce00asx6ntYTrWGatP5PWFvL6Si39LU1Mi</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>dataset</recordtype></control><display><type>dataset</type><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><source>DataCite</source><creator>Mayr, Sina ; Finizio, Simone ; Reuteler, Joakim ; Stutz, Stefan ; Dubs, Carsten ; Weigand, Markus ; Hrabec, Aleš ; Raabe, Jörg ; Wintz, Sebastian</creator><creatorcontrib>Mayr, Sina ; Finizio, Simone ; Reuteler, Joakim ; Stutz, Stefan ; Dubs, Carsten ; Weigand, Markus ; Hrabec, Aleš ; Raabe, Jörg ; Wintz, Sebastian</creatorcontrib><description>Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany</description><identifier>DOI: 10.5281/zenodo.4753180</identifier><language>eng</language><publisher>Zenodo</publisher><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>776,1887</link.rule.ids><linktorsrc>$$Uhttps://commons.datacite.org/doi.org/10.5281/zenodo.4753180$$EView_record_in_DataCite.org$$FView_record_in_$$GDataCite.org$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Mayr, Sina</creatorcontrib><creatorcontrib>Finizio, Simone</creatorcontrib><creatorcontrib>Reuteler, Joakim</creatorcontrib><creatorcontrib>Stutz, Stefan</creatorcontrib><creatorcontrib>Dubs, Carsten</creatorcontrib><creatorcontrib>Weigand, Markus</creatorcontrib><creatorcontrib>Hrabec, Aleš</creatorcontrib><creatorcontrib>Raabe, Jörg</creatorcontrib><creatorcontrib>Wintz, Sebastian</creatorcontrib><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><description>Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany</description><fulltext>true</fulltext><rsrctype>dataset</rsrctype><creationdate>2021</creationdate><recordtype>dataset</recordtype><sourceid>PQ8</sourceid><recordid>eNotjztPwzAUhb0woMLKbHVPcOw4dkYoFCoVFdEM3cKNfY0iJU4Um6H8etLHdHQeOtJHyEPGUsl19viHfrBDmispMs1uyfcLRAgYqRsmujzMraefHYQe6HowvwEt3czRM0JPP9qua_3PebprIrT-5PaDi_SQfMGRVhP4MMKEPtI99GOHYXlHbhx0Ae-vuiDV-rVavSfb3dtm9bRNrCpZUmjGc1BoGtCOWdCFZFZJ0BpVY5iThnMEbhonhWLWlehyVRYlF0oaLYRYkPRya2ce00asx6ntYTrWGatP5PWFvL6Si39LU1Mi</recordid><startdate>20210513</startdate><enddate>20210513</enddate><creator>Mayr, Sina</creator><creator>Finizio, Simone</creator><creator>Reuteler, Joakim</creator><creator>Stutz, Stefan</creator><creator>Dubs, Carsten</creator><creator>Weigand, Markus</creator><creator>Hrabec, Aleš</creator><creator>Raabe, Jörg</creator><creator>Wintz, Sebastian</creator><general>Zenodo</general><scope>DYCCY</scope><scope>PQ8</scope></search><sort><creationdate>20210513</creationdate><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><author>Mayr, Sina ; Finizio, Simone ; Reuteler, Joakim ; Stutz, Stefan ; Dubs, Carsten ; Weigand, Markus ; Hrabec, Aleš ; Raabe, Jörg ; Wintz, Sebastian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-d790-68024a7ecba8f0da8650d75a88e7bc0f5c22ea2cbf5370df9ef479692375c8333</frbrgroupid><rsrctype>datasets</rsrctype><prefilter>datasets</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Mayr, Sina</creatorcontrib><creatorcontrib>Finizio, Simone</creatorcontrib><creatorcontrib>Reuteler, Joakim</creatorcontrib><creatorcontrib>Stutz, Stefan</creatorcontrib><creatorcontrib>Dubs, Carsten</creatorcontrib><creatorcontrib>Weigand, Markus</creatorcontrib><creatorcontrib>Hrabec, Aleš</creatorcontrib><creatorcontrib>Raabe, Jörg</creatorcontrib><creatorcontrib>Wintz, Sebastian</creatorcontrib><collection>DataCite (Open Access)</collection><collection>DataCite</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mayr, Sina</au><au>Finizio, Simone</au><au>Reuteler, Joakim</au><au>Stutz, Stefan</au><au>Dubs, Carsten</au><au>Weigand, Markus</au><au>Hrabec, Aleš</au><au>Raabe, Jörg</au><au>Wintz, Sebastian</au><format>book</format><genre>unknown</genre><ristype>DATA</ristype><title>Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples"</title><date>2021-05-13</date><risdate>2021</risdate><abstract>Dataset associated with the publication "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" by Sina Mayr 1,2,*, Simone Finizio 1, Joakim Reuteler 3, Stefan Stutz 1, Carsten Dubs 4, Markus Weigand 5, Aleš Hrabec 1,2,6, Jörg Raabe 1 and Sebastian Wintz 1,7,*. 1 Paul Scherrer Institut, 5232 Villigen PSI, Switzerland 2 Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 3 Scientific Center for Optical and Electron Microscopy, ETH Zurich, 8093 Zurich, Switzerland 4 INNOVENT e.V. Technologieentwicklung Jena, 07745 Jena, Germany 5 Helmholtz-Zentrum Berlin, 14109 Berlin, Germany 6 Laboratory for Magnetism and Interface Physics, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland 7 Max Planck Institute for Intelligent Systems, 70569 Stuttgart, Germany</abstract><pub>Zenodo</pub><doi>10.5281/zenodo.4753180</doi><oa>free_for_read</oa></addata></record> |
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identifier | DOI: 10.5281/zenodo.4753180 |
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title | Dataset for "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-Ray Transparent Samples" |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T01%3A12%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-datacite_PQ8&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.au=Mayr,%20Sina&rft.date=2021-05-13&rft_id=info:doi/10.5281/zenodo.4753180&rft_dat=%3Cdatacite_PQ8%3E10_5281_zenodo_4753180%3C/datacite_PQ8%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |