Stim circuits for 'Accommodating Fabrication Defects on Floquet Codes with Minimal Hardware Requirements' manuscript

Example Stim circuits for Honeycomb quantum memory experiments with defective qubits. Because accommodating each sample of fabrication defects requires a separate Stim circuit, we only provide example circuits rather than all Stim circuits used in simulations. Please note that the example circuits presented here are constructed by sampling defective qubits according to an iid distribution, with a single parameter defining the probability of an individual qubit being defective. In general a circuit which has a higher probability of each qubit being defective will perform worse than a circuit which has a lower probability of each qubit being defective. However, this does not necessarily mean that the specific circuits presented here will see that behaviour, as these are just individual samples from a large distribution.