IODP Expedition 395E X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light element...

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Hauptverfasser: Coggon, Rosalind M., Teagle, Damon A.H., Sylvan, Jason B., Reece, Julia, Estes, Emily R., Williams, Trevor J., Aizawa, Masataka, Albers, Elmar, Amadori, Chiara, Belgrano, Thomas M., Borrelli, Chiara, Bridges, Joshua D., Carter, Elliott J., Christeson, Gail L., D'Angelo, Timothy, Dinarès-Turell, Jaume, Doi, Nobuhiro, Estep, Justin D., Evans, Aled, Gilhooly III, William P., Grant, Lewis J.C., Guérin, Gilles M., Harris, Michelle, Hojnacki, Victoria M., Hong, Gilbert, Jin, Xiaobo, Jonnalagadda, Mallika, Kaplan, Michael R., Kempton, Pamela D., Kurz, Walter, Kuwano, Daisuke, Labonte, Jessica M., Lam, Adriane R., Latas, Marcin, Lowery, Christopher M., Lu, Wanyi, McIntyre, Andrew, Moal-Darrigade, Paul, Pekar, Stephen F., Prakasam, Muthusamy, Robustelli Test, Claudio, Routledge, Claire M., Ryan, Jeffrey G., Santiago Ramos, Danielle, Shchepetkina, Alina, Slagle, Angela L., Takada, Mako, Tamborrino, Leonardo, Tian, Liyan, Villa, Alexandra, Wang, Yi, Wee, Shu Ying, Widlansky, Sarah J., Yang, Kiho, Yu, Tiantian, Zhang, Guoliang
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Sprache:eng
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