Dataset: The perils and pitfalls of block design for EEG classification experiments

Dataset asscociated with a paper in IEEE Transactions on Pattern Analysis and Machine Intelligence"The perils and pitfalls of block design for EEG classification experiments"DOI: 10.1109/TPAMI.2020.2973153 If you use this data, please cite the above paper.

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Hauptverfasser: Li, Ren, Johansen, Jared S., Ahmed, Hamad, Ilyevsky, Thomas V., Wilbur, Ronnie B., Bharadwaj, Hari M, Siskind, Jeffrey Mark
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creator Li, Ren
Johansen, Jared S.
Ahmed, Hamad
Ilyevsky, Thomas V.
Wilbur, Ronnie B.
Bharadwaj, Hari M
Siskind, Jeffrey Mark
description Dataset asscociated with a paper in IEEE Transactions on Pattern Analysis and Machine Intelligence"The perils and pitfalls of block design for EEG classification experiments"DOI: 10.1109/TPAMI.2020.2973153 If you use this data, please cite the above paper.
doi_str_mv 10.21227/416j-3r62
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identifier DOI: 10.21227/416j-3r62
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language eng
recordid cdi_datacite_primary_10_21227_416j_3r62
source DataCite
subjects Artificial Intelligence
Brain
Computational Intelligence
Computer Vision
Digital signal processing
Discrete-time signal processing
EEG
Image Processing
Machine Learning
Neuroscience
title Dataset: The perils and pitfalls of block design for EEG classification experiments
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