SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different layers of the system is a very complex task that requires the support of dedicat...

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Veröffentlicht in:	IEEE transactions on computers 2019-05, Vol.68 (5), p.765-783
Hauptverfasser:	Vallero, A., Savino, A., Chatzidimitriou, A., Kaliorakis, M., Kooli, M., Riera, M., Anglada, M., Di Natale, G., Bosio, A., Canal, R., Gonzalez, A., Gizopoulos, D., Mariani, R., Di Carlo, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bayes methods Bayesian analysis Complexity Complexity theory Computer architecture Computer memory Computer simulation Cross-layer Decision analysis Engineering Sciences Failures-in-Time Hardware Informàtica Micro and nanotechnologies Microelectronics Microprocessadors Microprocessors Radiation effects Reliability Reliability analysis Resilience Soft errors Software reliability Statistical inference System reliability Àrees temàtiques de la UPC
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