An X-ray photoelectron spectroscopy study of the hydration of C2S thin films

Electron-beam evaporation was used to produce thin films of β-dicalcium silicate. Chemical and mineralogical compositions were characterized by X-ray photoelectron spectroscopy (XPS) and grazing-angle X-ray diffraction (GAXRD), respectively. Results show that no fractionation occurs during evaporati...

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Veröffentlicht in:Cement and concrete research 2014-06, Vol.60, p.83-90
Hauptverfasser: Rheinheimer, Vanessa, Casanova, Ignasi
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Casanova, Ignasi
description Electron-beam evaporation was used to produce thin films of β-dicalcium silicate. Chemical and mineralogical compositions were characterized by X-ray photoelectron spectroscopy (XPS) and grazing-angle X-ray diffraction (GAXRD), respectively. Results show that no fractionation occurs during evaporation and isostructural condensation of the material as synthesized films have the same composition as the initial bulk material. Samples were gradually hydrated under saturated water spray conditions and analyzed with XPS. Polymerization of the silicate chains due to hydration, and subsequent formation of C-S-H, has been monitored through evaluation of energy shifts on characteristic silicon peaks. Quantitative analyses show changes on the surface by the reduction of the Ca/Si ratio and an increase on the difference between binding energies of bridging and non-bridging oxygen. Finally, SEM/FIB observation shows clear differences between the surface and cross section of the initial sample and the reacted sample.
doi_str_mv 10.1016/j.cemconres.2014.03.005
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source ScienceDirect Journals (5 years ago - present); Recercat
subjects Applied sciences
Buildings. Public works
C-S-H
Cement
Cement concrete constituents
Cements
Ciment
Enginyeria civil
Exact sciences and technology
Hidratació
Hydration
Materials
Materials i estructures
Materials i estructures de formigó
Properties of anhydrous and hydrated cement, test methods
Thin films
X-ray photoelectron spectroscopy
ß-Dicalcium silicate
Àrees temàtiques de la UPC
β-Dicalcium silicate
title An X-ray photoelectron spectroscopy study of the hydration of C2S thin films
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