Resistance switching in transparent magnetic MgO films

We have studied the abrupt and hysteretic changes of resistance in MgO-based capacitor devices. The switching behavior is discussed in terms of the formation and rupture of conduction filaments due to the migration of structural defects in the electric field, together with the redox events which aff...

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Veröffentlicht in:Solid state communications 2011-12, Vol.151 (24), p.1856-1859
Hauptverfasser: Jambois, O., Carreras, P., Antony, A., Bertomeu, J., Martínez-Boubeta, C.
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Sprache:eng
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