Majority-carrier capture cross-section determination in the large deep-trap concentration cases

A method to determine the thermal cross section of a deep level from capacitance measurements is reported. The results enable us to explain the nonexponential behavior of the capacitance versus capture time when the trap concentration is not negligible with respect to that of the shallow one, and th...

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Veröffentlicht in:	Journal of applied physics 1986-03, Vol.59 (5), p.1562-1569
Hauptverfasser:	MORANTE, J. R, SAMITIER, J, CORNET, A, HERMS, A, CARTUJO, P
Format:	Artikel
Sprache:	eng
Schlagworte:	Charge carriers: generation, recombination, lifetime, and trapping Condensed matter Condensed matter: electronic structure, electrical, magnetic, and optical properties Conductivity phenomena in semiconductors and insulators Electronic structure Electronic transport in condensed matter Estructura electrònica Exact sciences and technology Materials Matèria condensada Physics
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