Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges

We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 1994
Hauptverfasser:	Nguyen, T. D, O'Callaghan Castellà, Juan Manuel, Davidson, B. A, Redwing, R. D, Hohenwarter, G. K. G, Nordman, J. E, Beyer, J. B
Format:	Artikel
Sprache:	eng
Schlagworte:	1/f noise barium compounds Circuits de microones, radiofreqüència i ones mil·limètriques Enginyeria de la telecomunicació flux flow flux pinning High temperature superconductors Radiocomunicació i exploració electromagnètica superconducting device noise superconducting device testing superconducting microbridges superconducting thin films Superconductivitat Superconductivity Superconductors a altes temperatures yttrium compounds Àrees temàtiques de la UPC
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Zusammenfassung:	We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage. Peer Reviewed
ISSN:	1051-8223