Measure of roughness of paper using speckle
Roughness of a paper surface is particularly important in paper and board destined to be printed. Surfaces are often coated and the amount of coating and method of application used depends on the roughness of the base paper. We present a method of measure of the roughness of the paper based in the a...
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creator | Pino, Abdiel Pladellorens, Josep |
description | Roughness of a paper surface is particularly important in paper and board destined to be printed. Surfaces are often coated and the amount of coating and method of application used depends on the roughness of the base paper. We present a method of measure of the roughness of the paper based in the analysis of speckle pattern on the surface. Images are captured by means of a simple configuration using a laser and a camera CCD. Then, we apply digital image processing using the co-occurrence matrix, so this method can be considered as a non-contact surface profiling method, that can be used online. |
doi_str_mv | 10.1117/12.825072 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>proquest_XX2</sourceid><recordid>TN_cdi_csuc_recercat_oai_recercat_cat_2072_185404</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>864414571</sourcerecordid><originalsourceid>FETCH-LOGICAL-c407t-1b06ceec032e3a989c7e4cc8f61335bebe210c7d3f3a807d132f316b455cb9493</originalsourceid><addsrcrecordid>eNp9kd9LAzEMxwsq-PPB_2AvKiKbTdpee48ypw4UBRV8K70up6e33dnuHvzv7byB-GIgJCGfbyAJY4fARwCgzwFHBhXXuMF2uYFcao2Im2yHo9ZDbbKXbbYb4zvnaJTOd9jZHbnYBRo05SA03evbgmJcFa1rKQy6WC1eB7El_1HTPtsqXR3pYB332PPV5Gl8M7y9v56OL26HXnK9HELBM0_kuUASLje51yS9N2UGQqiCCkLgXs9EKZzhegYCSwFZIZXyRS5zscegn-tj520gT8G7pW1c9VusHNOeFoySXCbNSa9pQ_PZUVzaeRU91bVbUNNFazIpQSoNiTz-lxQyz41QmMCjNeiid3UZ3MJX0bahmrvwZREFAqBK3GnPxbai1G7S8rN0tmiB29VXLKDtv5JY_MP2ox4ep4-X15xrKZCvDH6ySZ-Lb0tTifU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>34998352</pqid></control><display><type>conference_proceeding</type><title>Measure of roughness of paper using speckle</title><source>Recercat</source><creator>Pino, Abdiel ; Pladellorens, Josep</creator><contributor>Yoshizawa |f Toru ; Harding |f Kevin G. (eds.) ; Huang |f Peisen S</contributor><creatorcontrib>Pino, Abdiel ; Pladellorens, Josep ; Yoshizawa |f Toru ; Harding |f Kevin G. (eds.) ; Huang |f Peisen S</creatorcontrib><description>Roughness of a paper surface is particularly important in paper and board destined to be printed. Surfaces are often coated and the amount of coating and method of application used depends on the roughness of the base paper. We present a method of measure of the roughness of the paper based in the analysis of speckle pattern on the surface. Images are captured by means of a simple configuration using a laser and a camera CCD. Then, we apply digital image processing using the co-occurrence matrix, so this method can be considered as a non-contact surface profiling method, that can be used online.</description><identifier>ISSN: 0277-786X</identifier><identifier>ISBN: 0819477222</identifier><identifier>ISBN: 9780819477224</identifier><identifier>DOI: 10.1117/12.825072</identifier><identifier>CODEN: PSISDG</identifier><language>eng</language><publisher>Bellingham, Wash: SPIE</publisher><subject>Applied sciences ; Charge coupled devices ; Communication, education, history, and philosophy ; Enginyeria paperera ; Exact sciences and technology ; Fundamental areas of phenomenology (including applications) ; Imaging and optical processing ; Indústria i comerç ; Inspection ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Lasers ; Metrology ; On-line systems ; Optical instruments, equipment and techniques ; Optics ; Other techniques and industries ; Paper coatings ; Physics ; Physics literature and publications ; Productes paperers ; Roughness ; Speckle ; Speckle and moire patterns ; Superfícies ; Surface roughness ; Àrees temàtiques de la UPC</subject><ispartof>Proceedings of SPIE, 2009, Vol.7432 (1), p.74320E-74320E-9</ispartof><rights>2009 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.</rights><rights>COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.</rights><rights>2015 INIST-CNRS</rights><rights>Copyright 2009 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. info:eu-repo/semantics/openAccess <a href="http://creativecommons.org/licenses/by-nc-nd/3.0/es/">http://creativecommons.org/licenses/by-nc-nd/3.0/es/</a></rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c407t-1b06ceec032e3a989c7e4cc8f61335bebe210c7d3f3a807d132f316b455cb9493</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,309,310,777,882,25121,26955</link.rule.ids><linktorsrc>$$Uhttps://recercat.cat/handle/2072/185404$$EView_record_in_Consorci_de_Serveis_Universitaris_de_Catalunya_(CSUC)$$FView_record_in_$$GConsorci_de_Serveis_Universitaris_de_Catalunya_(CSUC)$$Hfree_for_read</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22321125$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><contributor>Yoshizawa |f Toru</contributor><contributor>Harding |f Kevin G. (eds.)</contributor><contributor>Huang |f Peisen S</contributor><creatorcontrib>Pino, Abdiel</creatorcontrib><creatorcontrib>Pladellorens, Josep</creatorcontrib><title>Measure of roughness of paper using speckle</title><title>Proceedings of SPIE</title><description>Roughness of a paper surface is particularly important in paper and board destined to be printed. Surfaces are often coated and the amount of coating and method of application used depends on the roughness of the base paper. We present a method of measure of the roughness of the paper based in the analysis of speckle pattern on the surface. Images are captured by means of a simple configuration using a laser and a camera CCD. Then, we apply digital image processing using the co-occurrence matrix, so this method can be considered as a non-contact surface profiling method, that can be used online.</description><subject>Applied sciences</subject><subject>Charge coupled devices</subject><subject>Communication, education, history, and philosophy</subject><subject>Enginyeria paperera</subject><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Imaging and optical processing</subject><subject>Indústria i comerç</subject><subject>Inspection</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Lasers</subject><subject>Metrology</subject><subject>On-line systems</subject><subject>Optical instruments, equipment and techniques</subject><subject>Optics</subject><subject>Other techniques and industries</subject><subject>Paper coatings</subject><subject>Physics</subject><subject>Physics literature and publications</subject><subject>Productes paperers</subject><subject>Roughness</subject><subject>Speckle</subject><subject>Speckle and moire patterns</subject><subject>Superfícies</subject><subject>Surface roughness</subject><subject>Àrees temàtiques de la UPC</subject><issn>0277-786X</issn><isbn>0819477222</isbn><isbn>9780819477224</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>XX2</sourceid><recordid>eNp9kd9LAzEMxwsq-PPB_2AvKiKbTdpee48ypw4UBRV8K70up6e33dnuHvzv7byB-GIgJCGfbyAJY4fARwCgzwFHBhXXuMF2uYFcao2Im2yHo9ZDbbKXbbYb4zvnaJTOd9jZHbnYBRo05SA03evbgmJcFa1rKQy6WC1eB7El_1HTPtsqXR3pYB332PPV5Gl8M7y9v56OL26HXnK9HELBM0_kuUASLje51yS9N2UGQqiCCkLgXs9EKZzhegYCSwFZIZXyRS5zscegn-tj520gT8G7pW1c9VusHNOeFoySXCbNSa9pQ_PZUVzaeRU91bVbUNNFazIpQSoNiTz-lxQyz41QmMCjNeiid3UZ3MJX0bahmrvwZREFAqBK3GnPxbai1G7S8rN0tmiB29VXLKDtv5JY_MP2ox4ep4-X15xrKZCvDH6ySZ-Lb0tTifU</recordid><startdate>20090101</startdate><enddate>20090101</enddate><creator>Pino, Abdiel</creator><creator>Pladellorens, Josep</creator><general>SPIE</general><scope>IQODW</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope><scope>XX2</scope></search><sort><creationdate>20090101</creationdate><title>Measure of roughness of paper using speckle</title><author>Pino, Abdiel ; Pladellorens, Josep</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c407t-1b06ceec032e3a989c7e4cc8f61335bebe210c7d3f3a807d132f316b455cb9493</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Charge coupled devices</topic><topic>Communication, education, history, and philosophy</topic><topic>Enginyeria paperera</topic><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Imaging and optical processing</topic><topic>Indústria i comerç</topic><topic>Inspection</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Lasers</topic><topic>Metrology</topic><topic>On-line systems</topic><topic>Optical instruments, equipment and techniques</topic><topic>Optics</topic><topic>Other techniques and industries</topic><topic>Paper coatings</topic><topic>Physics</topic><topic>Physics literature and publications</topic><topic>Productes paperers</topic><topic>Roughness</topic><topic>Speckle</topic><topic>Speckle and moire patterns</topic><topic>Superfícies</topic><topic>Surface roughness</topic><topic>Àrees temàtiques de la UPC</topic><toplevel>online_resources</toplevel><creatorcontrib>Pino, Abdiel</creatorcontrib><creatorcontrib>Pladellorens, Josep</creatorcontrib><collection>Pascal-Francis</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><collection>Recercat</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pino, Abdiel</au><au>Pladellorens, Josep</au><au>Yoshizawa |f Toru</au><au>Harding |f Kevin G. (eds.)</au><au>Huang |f Peisen S</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Measure of roughness of paper using speckle</atitle><btitle>Proceedings of SPIE</btitle><date>2009-01-01</date><risdate>2009</risdate><volume>7432</volume><issue>1</issue><spage>74320E</spage><epage>74320E-9</epage><pages>74320E-74320E-9</pages><issn>0277-786X</issn><isbn>0819477222</isbn><isbn>9780819477224</isbn><coden>PSISDG</coden><abstract>Roughness of a paper surface is particularly important in paper and board destined to be printed. Surfaces are often coated and the amount of coating and method of application used depends on the roughness of the base paper. We present a method of measure of the roughness of the paper based in the analysis of speckle pattern on the surface. Images are captured by means of a simple configuration using a laser and a camera CCD. Then, we apply digital image processing using the co-occurrence matrix, so this method can be considered as a non-contact surface profiling method, that can be used online.</abstract><cop>Bellingham, Wash</cop><pub>SPIE</pub><doi>10.1117/12.825072</doi><oa>free_for_read</oa></addata></record> |
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subjects | Applied sciences Charge coupled devices Communication, education, history, and philosophy Enginyeria paperera Exact sciences and technology Fundamental areas of phenomenology (including applications) Imaging and optical processing Indústria i comerç Inspection Instruments, apparatus, components and techniques common to several branches of physics and astronomy Lasers Metrology On-line systems Optical instruments, equipment and techniques Optics Other techniques and industries Paper coatings Physics Physics literature and publications Productes paperers Roughness Speckle Speckle and moire patterns Superfícies Surface roughness Àrees temàtiques de la UPC |
title | Measure of roughness of paper using speckle |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T13%3A59%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_XX2&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Measure%20of%20roughness%20of%20paper%20using%20speckle&rft.btitle=Proceedings%20of%20SPIE&rft.au=Pino,%20Abdiel&rft.date=2009-01-01&rft.volume=7432&rft.issue=1&rft.spage=74320E&rft.epage=74320E-9&rft.pages=74320E-74320E-9&rft.issn=0277-786X&rft.isbn=0819477222&rft.isbn_list=9780819477224&rft.coden=PSISDG&rft_id=info:doi/10.1117/12.825072&rft_dat=%3Cproquest_XX2%3E864414571%3C/proquest_XX2%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=34998352&rft_id=info:pmid/&rfr_iscdi=true |