Wavelength dependent in-plane birefringence of transparent flexible films determined by using transmission ellipsometry
We introduce a simple method to determine the in-plane birefringence of transparent flexible films by using transmission spectroscopic ellipsometry. The pseudo-ellipsometric constants which can represent their sample azimuthal angle dependent characteristics are introduced. The effect of in-plane bi...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2018-05, Vol.57 (5S), p.5 |
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| container_title | Japanese Journal of Applied Physics |
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| creator | Yang, Sung Mo Hong, Sera Kim, Sang Youl |
| description | We introduce a simple method to determine the in-plane birefringence of transparent flexible films by using transmission spectroscopic ellipsometry. The pseudo-ellipsometric constants which can represent their sample azimuthal angle dependent characteristics are introduced. The effect of in-plane birefringence and sample azimuthal angle on the pseudo ellipsometric constants is calculated using Jones matrix formalism, and the observed sample azimuthal angle dependence of measured pseudo-ellipsometric data is well understood. Wavelength dependence of in-plane birefringence is expressed in terms of the Sellmeier dispersion equation. The best fit pseudo-ellipsometric spectra to the measured ones at the sample azimuthal angles of every 15° from 0 to 90° are searched. The dispersion coefficients of the Sellmeier equation and the azimuthal angle of the optic axis are determined for polycarbonate (PC), poly(ethylene naphthalate) (PEN), poly(ethylene terephthalate) (PET), polyimide (PI), and colorless polyimide (CPI) films. |
| doi_str_mv | 10.7567/JJAP.57.05GB03 |
| format | Article |
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The pseudo-ellipsometric constants which can represent their sample azimuthal angle dependent characteristics are introduced. The effect of in-plane birefringence and sample azimuthal angle on the pseudo ellipsometric constants is calculated using Jones matrix formalism, and the observed sample azimuthal angle dependence of measured pseudo-ellipsometric data is well understood. Wavelength dependence of in-plane birefringence is expressed in terms of the Sellmeier dispersion equation. The best fit pseudo-ellipsometric spectra to the measured ones at the sample azimuthal angles of every 15° from 0 to 90° are searched. The dispersion coefficients of the Sellmeier equation and the azimuthal angle of the optic axis are determined for polycarbonate (PC), poly(ethylene naphthalate) (PEN), poly(ethylene terephthalate) (PET), polyimide (PI), and colorless polyimide (CPI) films.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.7567/JJAP.57.05GB03</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>Tokyo: The Japan Society of Applied Physics</publisher><subject>Birefringence ; Constants ; Dependence ; Polycarbonate resins ; Polyethylene naphthalate ; Polyethylene terephthalate ; Spectroellipsometry</subject><ispartof>Japanese Journal of Applied Physics, 2018-05, Vol.57 (5S), p.5</ispartof><rights>2018 The Japan Society of Applied Physics</rights><rights>Copyright Japanese Journal of Applied Physics May 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c302t-1a78c81cf5f8e2ce84bebb3bd8f37a58ff7c53ebe58161d2b506c0797c8d8453</citedby><cites>FETCH-LOGICAL-c302t-1a78c81cf5f8e2ce84bebb3bd8f37a58ff7c53ebe58161d2b506c0797c8d8453</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.7567/JJAP.57.05GB03/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27924,27925,53846,53893</link.rule.ids></links><search><creatorcontrib>Yang, Sung Mo</creatorcontrib><creatorcontrib>Hong, Sera</creatorcontrib><creatorcontrib>Kim, Sang Youl</creatorcontrib><title>Wavelength dependent in-plane birefringence of transparent flexible films determined by using transmission ellipsometry</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>We introduce a simple method to determine the in-plane birefringence of transparent flexible films by using transmission spectroscopic ellipsometry. The pseudo-ellipsometric constants which can represent their sample azimuthal angle dependent characteristics are introduced. The effect of in-plane birefringence and sample azimuthal angle on the pseudo ellipsometric constants is calculated using Jones matrix formalism, and the observed sample azimuthal angle dependence of measured pseudo-ellipsometric data is well understood. Wavelength dependence of in-plane birefringence is expressed in terms of the Sellmeier dispersion equation. The best fit pseudo-ellipsometric spectra to the measured ones at the sample azimuthal angles of every 15° from 0 to 90° are searched. The dispersion coefficients of the Sellmeier equation and the azimuthal angle of the optic axis are determined for polycarbonate (PC), poly(ethylene naphthalate) (PEN), poly(ethylene terephthalate) (PET), polyimide (PI), and colorless polyimide (CPI) films.</description><subject>Birefringence</subject><subject>Constants</subject><subject>Dependence</subject><subject>Polycarbonate resins</subject><subject>Polyethylene naphthalate</subject><subject>Polyethylene terephthalate</subject><subject>Spectroellipsometry</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kMFLwzAUh4MoOKdXzwFvQmvSNE12nEOnY6CHgcfQpC8zo01r0qn77-2o4MnT48H3_R7vh9A1JanghbhbreavKRcp4ct7wk7QhLJcJDkp-CmaEJLRJJ9l2Tm6iHE3rAXP6QR9vZWfUIPf9u-4gg58Bb7HziddXXrA2gWwwfkteAO4tbgPpY9dGY6UreHb6RqwdXUTB72H0DgPFdYHvI-DNeKNi9G1HkNduy62DfThcInObFlHuPqdU7R5fNgsnpL1y_J5MV8nhpGsT2gppJHUWG4lZAZkrkFrpitpmSi5tFYYzkADl7SgVaY5KQwRM2FkJXPOpuhmjO1C-7GH2Ktduw9-uKgykouMScLFQKUjZUIb4_Cx6oJrynBQlKhjt-rYreJCjd0Owu0ouLb7S_wH_gFsy32C</recordid><startdate>20180501</startdate><enddate>20180501</enddate><creator>Yang, Sung Mo</creator><creator>Hong, Sera</creator><creator>Kim, Sang Youl</creator><general>The Japan Society of Applied Physics</general><general>Japanese Journal of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20180501</creationdate><title>Wavelength dependent in-plane birefringence of transparent flexible films determined by using transmission ellipsometry</title><author>Yang, Sung Mo ; Hong, Sera ; Kim, Sang Youl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c302t-1a78c81cf5f8e2ce84bebb3bd8f37a58ff7c53ebe58161d2b506c0797c8d8453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Birefringence</topic><topic>Constants</topic><topic>Dependence</topic><topic>Polycarbonate resins</topic><topic>Polyethylene naphthalate</topic><topic>Polyethylene terephthalate</topic><topic>Spectroellipsometry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yang, Sung Mo</creatorcontrib><creatorcontrib>Hong, Sera</creatorcontrib><creatorcontrib>Kim, Sang Youl</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yang, Sung Mo</au><au>Hong, Sera</au><au>Kim, Sang Youl</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Wavelength dependent in-plane birefringence of transparent flexible films determined by using transmission ellipsometry</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2018-05-01</date><risdate>2018</risdate><volume>57</volume><issue>5S</issue><spage>5</spage><pages>5-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>We introduce a simple method to determine the in-plane birefringence of transparent flexible films by using transmission spectroscopic ellipsometry. The pseudo-ellipsometric constants which can represent their sample azimuthal angle dependent characteristics are introduced. The effect of in-plane birefringence and sample azimuthal angle on the pseudo ellipsometric constants is calculated using Jones matrix formalism, and the observed sample azimuthal angle dependence of measured pseudo-ellipsometric data is well understood. Wavelength dependence of in-plane birefringence is expressed in terms of the Sellmeier dispersion equation. The best fit pseudo-ellipsometric spectra to the measured ones at the sample azimuthal angles of every 15° from 0 to 90° are searched. The dispersion coefficients of the Sellmeier equation and the azimuthal angle of the optic axis are determined for polycarbonate (PC), poly(ethylene naphthalate) (PEN), poly(ethylene terephthalate) (PET), polyimide (PI), and colorless polyimide (CPI) films.</abstract><cop>Tokyo</cop><pub>The Japan Society of Applied Physics</pub><doi>10.7567/JJAP.57.05GB03</doi></addata></record> |
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| ispartof | Japanese Journal of Applied Physics, 2018-05, Vol.57 (5S), p.5 |
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| language | eng |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Birefringence Constants Dependence Polycarbonate resins Polyethylene naphthalate Polyethylene terephthalate Spectroellipsometry |
| title | Wavelength dependent in-plane birefringence of transparent flexible films determined by using transmission ellipsometry |
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