On the limits of applicability of drift-diffusion based hot carrier degradation modeling

We study the limits of the applicability of a drift-diffusion (DD) based model for hot-carrier degradation (HCD). In this approach the rigorous but computationally expensive solution of the Boltzmann transport equation is replaced by an analytic expression for the carrier energy distribution functio...

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Veröffentlicht in:	Japanese Journal of Applied Physics 2016-04, Vol.55 (4S), p.4
Hauptverfasser:	Jech, Markus, Sharma, Prateek, Tyaginov, Stanislav, Rudolf, Florian, Grasser, Tibor
Format:	Artikel
Sprache:	eng
Schlagworte:	Boltzmann transport equation Carriers Degradation Devices Drift Gates Mathematical analysis Mathematical models
Online-Zugang:	Volltext
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